2014
DOI: 10.7567/jjap.53.04ep17
|View full text |Cite
|
Sign up to set email alerts
|

Hot carrier effect of a scaled thin-film silicon-on-insulator power metal oxide semiconductor field-effect transistor under constant drain electric field

Abstract: We report a hot carrier effect of the thin-film silicon-on-insulator (SOI) power metal oxide semiconductor field-effect transistor (MOSFET) for scaling under a constant drain electric field. The device degradation caused by the hot carrier effect was enhanced by shrinking a channel length even at the constant drain electric field because of the parasitic bipolar effect.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
4
1

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(7 citation statements)
references
References 24 publications
0
7
0
Order By: Relevance
“…2(a), 2(b), and 2(c). 18) The electric field distribution is simulated by using TCAD 24) and shown as a dotted line in Fig. 2(a).…”
Section: Device Structure and Fabrication Processmentioning
confidence: 99%
See 1 more Smart Citation
“…2(a), 2(b), and 2(c). 18) The electric field distribution is simulated by using TCAD 24) and shown as a dotted line in Fig. 2(a).…”
Section: Device Structure and Fabrication Processmentioning
confidence: 99%
“…However, the parasitic bipolar effect is enhanced by decreasing channel length and this effect accelerates the hot carrier (HC) effect especially at the gate stress voltage near-threshold voltage. [17][18][19] We previously reported on the HC effect of thin-film SOI power MOSFETs under constant drain electric field. 17) In practical applications, the AC HC effect is important for lateral double-diffused power MOSFETs (LDMOS) based on the bulk Si technology.…”
Section: Introductionmentioning
confidence: 99%
“…4. The parasitic bipolar effect appears at a high drain voltage and this effect at 573 K is weak 5,7,19) because the impact ionization coefficient decreases as temperature increases.…”
Section: High-temperature Device Characteristicsmentioning
confidence: 99%
“…However, those of the thin-film SOI power MOSFET at high temperature were not discussed in previous studies. [5][6][7][18][19][20][21][22][23][24][25][26] For practical use, it is necessary to understand the degradation characteristics of a thin-film SOI power MOSFET at high temperature. Thus, we explore the hot carrier effect and PBTI of a thin-film SOI power MOSFET at high temperature experimentally.…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, in a DC-DC converter, a MOSFET on a silicon-on-insulator (SOI) substrate is used as a highfrequency switching device owing to its small parasitic capacitance, small leakage current, and immunity to temperature-induced latch-up. [5][6][7][8][9][10][11][12][13][14][15][16] However, the SOI MOSFET has a heat dissipation issue because it has a low-thermalconductivity SiO 2 layer used as a buried layer. 12,[17][18][19][20][21][22] This layer affects the increase in the operating temperature of SOI devices.…”
Section: Introductionmentioning
confidence: 99%