2011
DOI: 10.1063/1.3581038
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Hot spot analysis in integrated circuit substrates by laser mirage effect

Abstract: This work shows an analytical and experimental technique for characterizing radial heat flow present in integrated circuits ͑ICs͒ when power is dissipated by integrated devices. The analytical model comes from the resolution of the Fermat equation for the trajectory of rays and supposing a spherical heat source dissipating a time-periodic power. An application example is presented; hence demonstrating how hot spots and heat transfer phenomena in the IC substrate can be characterized. The developed method may b… Show more

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Cited by 11 publications
(5 citation statements)
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References 17 publications
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“…square exit geometry (Technologies for Research, Model: RT1 × 1) was used to generate a laminar and near adiabatic methane/air flame with sufficient optical access. This burner has been widely used as a test bed for laser diagnostic techniques [14][15][16][17][18][19][20]. The Hencken burner produces a unique, nearly adiabatic flame that is lifted from the burner surface since the fuel and oxidizer streams are separated until the exit of the burner.…”
Section: Methodsmentioning
confidence: 99%
“…square exit geometry (Technologies for Research, Model: RT1 × 1) was used to generate a laminar and near adiabatic methane/air flame with sufficient optical access. This burner has been widely used as a test bed for laser diagnostic techniques [14][15][16][17][18][19][20]. The Hencken burner produces a unique, nearly adiabatic flame that is lifted from the burner surface since the fuel and oxidizer streams are separated until the exit of the burner.…”
Section: Methodsmentioning
confidence: 99%
“…cooling, on the other hand, is the major bottleneck for proper functioning of devices due to the formation of local hot spots with large on-chip temperature gradients [5,6].…”
Section: Nano-grooved Heat Pipesmentioning
confidence: 99%
“…It should be stated that, system-level thermal management is not the critical issue due to the availability of capable conventional cooling methods [4]. Chip-level cooling, on the other hand, is the major bottleneck for proper functioning of devices due to the formation of local hot spots with large on-chip temperature gradients [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…To cover all such needs, off-chip single-shot imaging of nonelectrical observables (e.g., temperature or strain) is very promising [17], [18], [19], [20], as non-invasive testability of all internal nodes is assured while the RF-IC is under regular operation [21]. Thanks to the use combined of an RF block frequency-modulated driving and a mixer-like approach, electrical information is down converted from a higher to a lower frequency observable measured by following lock-in procedures (heterodyne technique) [20], [22], [23].…”
Section: Introductionmentioning
confidence: 99%