Optical Microlithography XVIII 2005
DOI: 10.1117/12.599908
|View full text |Cite
|
Sign up to set email alerts
|

How to describe polarization influence on imaging

Abstract: We give a general introduction into polarized imaging and report on a Jones-pupil approach for a complete evaluation of the resulting optical performance. The Jones pupil assigns a Jones matrix to each point of the exit pupil describing the impact of both the global phase and the polarization on imaging. While we can learn already a lot about the optical system by taking a close look at the Jones pupil -and starting imaging simulations from it -a quantitative assessment is necessary for a complete evaluation o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
26
0

Year Published

2011
2011
2023
2023

Publication Types

Select...
5
3

Relationship

0
8

Authors

Journals

citations
Cited by 35 publications
(26 citation statements)
references
References 8 publications
0
26
0
Order By: Relevance
“…In addition, the linear fitting of IPE and BFS is performed using the standard linear model expressed as 4 PZ , 9 PZ , 16 PZ and the corresponding fitting lines under linear polarization illumination (0,1) are shown in Figure 3. The IPE and BFS of that and the corresponding fitting lines under linear polarization illumination (1,1) are shown in Compare with the corresponding ratios -2 in Eq. (21) and (22) …”
Section: Simulations Results and Analysismentioning
confidence: 81%
See 2 more Smart Citations
“…In addition, the linear fitting of IPE and BFS is performed using the standard linear model expressed as 4 PZ , 9 PZ , 16 PZ and the corresponding fitting lines under linear polarization illumination (0,1) are shown in Figure 3. The IPE and BFS of that and the corresponding fitting lines under linear polarization illumination (1,1) are shown in Compare with the corresponding ratios -2 in Eq. (21) and (22) …”
Section: Simulations Results and Analysismentioning
confidence: 81%
“…As a major source of the polarization effects in lithography system, polarization aberration of projection lens can cause various undesirable effects, such as image placement error (IPE), best focus shift (BFS) and critical dimension (CD) errors and so on, leading to the degradation of image quality and process window [1][2][3] . As high NA projection lenses and polarized illumination are used in lithography system, the impact of polarization aberration on lithographic imaging quality can't be ignored any more.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Several representations of PA have been proposed, such as Jones pupil, physical pupil, Mueller pupil ,Pauli pupil and 3D PA [9][10][11][12][13][14] . The impact of scalar wavefront aberration or PA on image performance had been studied well based on thin mask 11,13,[15][16][17] , and their work adopt the simplified Kirchhoff approach. The results reveal that PA can evidently induce the pattern critical dimension(CD) error, best focus shift (BFS) and pattern placement error (PE), thus degrading the performance of the resist image.…”
Section: Introductionmentioning
confidence: 99%
“…Although numerical computation is effective for lithographic process analysis, it is usually time consuming. Totzeck et al in [5] proposed a useful method, which was based on the concept of complex contrast for analyzing imaging quality and polarization aberrations, and it gave their theoretical demonstrations. The critical relationship between imaging quality and polarization aberration is very important for aberration adjustment and lithography process control.…”
mentioning
confidence: 99%