2020
DOI: 10.1016/j.jelechem.2020.114647
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How to obtain kinetic information in thin-film voltammetry from the comparison of SCV and SWV responses

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Cited by 7 publications
(2 citation statements)
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“…This deviation might be attributed to ohmic drop, [8c] but the uncompensated resistance for the DOS‐based thin films was low (2 kΩ) and similar to that for the NPOE‐based films (1.7 kΩ). These results are in agreement with theoretical studies that indicated ohmic drop of thin films can be neglected [26] . Another reason for the difference might be the kinetics of electron transfer of the Ru‐bipod complex at the film‐electrode interface or kinetics of anion transfer at the membrane–water interface.…”
Section: Resultssupporting
confidence: 91%
See 1 more Smart Citation
“…This deviation might be attributed to ohmic drop, [8c] but the uncompensated resistance for the DOS‐based thin films was low (2 kΩ) and similar to that for the NPOE‐based films (1.7 kΩ). These results are in agreement with theoretical studies that indicated ohmic drop of thin films can be neglected [26] . Another reason for the difference might be the kinetics of electron transfer of the Ru‐bipod complex at the film‐electrode interface or kinetics of anion transfer at the membrane–water interface.…”
Section: Resultssupporting
confidence: 91%
“…These results are in agreement with theoretical studies that indicated ohmic drop of thin films can be neglected. [26] Another reason for the difference might be the kinetics of electron transfer of the Ru-bipod complex at the film-electrode interface or kinetics of anion transfer at the membrane-water interface. Since voltammetric and potentiometric studies of PF À 6 transfer showed Nernstian behaviour, the transfer of this ion at the water-membrane interface is fast and assumed not to be the limiting factor.…”
Section: Cyclic Voltammetry Confined In Thin Filmsmentioning
confidence: 99%