2011
DOI: 10.1016/j.jelechem.2011.02.016
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How well does simple RC circuit analysis describe diffuse double layer capacitance at smooth micro- and nanoelectrodes?

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Cited by 23 publications
(4 citation statements)
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“…Please note that, despite the lack of redox reactions at the electrodes, a charge transfer resistance must still be included in the circuit modeling since it influences the features of the tail-like impedance at low frequencies. The representation of this EDL part can be made with a variety of approaches including (i) a single capacitor, (ii) a parallel configuration of a capacitor and a resistor to account for the charge transfer (interfacial) resistance R p , ,, and (iii) a parallel configuration of R p and a constant phase element (CPE) to account for a capacitor with a distribution of time constants on the electrode surface. In this work, we use a modification of the latter approach. It should be noted that since both electrodes in the measurement cell are similar, we assume both have the same impedance response.…”
Section: Resultsmentioning
confidence: 99%
“…Please note that, despite the lack of redox reactions at the electrodes, a charge transfer resistance must still be included in the circuit modeling since it influences the features of the tail-like impedance at low frequencies. The representation of this EDL part can be made with a variety of approaches including (i) a single capacitor, (ii) a parallel configuration of a capacitor and a resistor to account for the charge transfer (interfacial) resistance R p , ,, and (iii) a parallel configuration of R p and a constant phase element (CPE) to account for a capacitor with a distribution of time constants on the electrode surface. In this work, we use a modification of the latter approach. It should be noted that since both electrodes in the measurement cell are similar, we assume both have the same impedance response.…”
Section: Resultsmentioning
confidence: 99%
“…Approaches for evaluating the integrity of and defects in the seal at electrode-insulator interfaces have included cyclic voltammetry (CV) 2,35,47,53,87 and electrochemical impedance spectroscopy (EIS). [88][89][90][91][92] Investigations that quantify charging current at microelectrodes using CV at different scan rates in aqueous supporting electrolyte at the gold-insulator interfaces have been reported for Si 3 N 4 , 93 glass, 47 polyimide, 94 Teflon TM , 47 and Tefzel TM . 95 The interfaces between other metals like platinum, silver, and nickel with Teflon TM have also been considered.…”
Section: R C U Dmentioning
confidence: 99%
“…1) that describes an electrolyte solution contacted by two electrodes. A more thorough description of this system and related equations can be found in [28]. In the Laplace domain, the voltage at the node V D in Fig.…”
Section: A Simple Equivalent Circuit Modelmentioning
confidence: 99%
“…C SL is assumed constant in the analytical model used to interpret the FEM simulation, while C dl is calculated numerically by simply integrating the charge in the diffuse layer (as obtained from the PNP simulation) and dividing by the voltage drop between the Stern Layer and the node V D . In this way, we extend the validity of the equivalent circuit to an applied potential much larger than the thermal voltage [28]. Assuming a 1D geometry for the sake of a simpler notation, the diffuse layer capacitance per unit area reads:…”
Section: A Simple Equivalent Circuit Modelmentioning
confidence: 99%