2022
DOI: 10.1002/smll.202107620
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Hybrid Deep Learning Crystallographic Mapping of Polymorphic Phases in Polycrystalline Hf0.5Zr0.5O2 Thin Films

Abstract: By controlling the configuration of polymorphic phases in high‐k Hf0.5Zr0.5O2 thin films, new functionalities such as persistent ferroelectricity at an extremely small scale can be exploited. To bolster the technological progress and fundamental understanding of phase stabilization (or transition) and switching behavior in the research area, efficient and reliable mapping of the crystal symmetry encompassing the whole scale of thin films is an urgent requisite. Atomic‐scale observation with electron microscopy… Show more

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Cited by 8 publications
(8 citation statements)
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“…The high-angle annular dark field (HAADF) imaging mode with a detector inner angle of ∼68 mrad was used to obtain atomic structure images of the samples. To distinguish crystal structures, position-averaged convergent beam electron diffraction (PACBED) and fast Fourier transform (FFT) analyses were subsequently conducted on the same regions observed by HAADF STEM. , Further, the chemical compositions at various depths of amorphous and crystalline HLO thin films were analyzed using depth profile X-ray photoelectron spectroscopy (XPS: ESCA 2000, MultiLab) with a monochromatic Al Kα X-ray source. The XPS spectra at different depths were recorded after etching with Ar for 300, 600, 900, and 1200 s. The recorded spectra were calibrated using the C 1s signature response at 284.6 eV.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…The high-angle annular dark field (HAADF) imaging mode with a detector inner angle of ∼68 mrad was used to obtain atomic structure images of the samples. To distinguish crystal structures, position-averaged convergent beam electron diffraction (PACBED) and fast Fourier transform (FFT) analyses were subsequently conducted on the same regions observed by HAADF STEM. , Further, the chemical compositions at various depths of amorphous and crystalline HLO thin films were analyzed using depth profile X-ray photoelectron spectroscopy (XPS: ESCA 2000, MultiLab) with a monochromatic Al Kα X-ray source. The XPS spectra at different depths were recorded after etching with Ar for 300, 600, 900, and 1200 s. The recorded spectra were calibrated using the C 1s signature response at 284.6 eV.…”
Section: Methodsmentioning
confidence: 99%
“…Notably, the films grown using the 2-ME+Aq-based precursor show a single-phase configuration, even at a thickness of ∼9 nm. Due to the structural similarities of the c-, t-, and ophases, 26,27 an extended investigation using atomic-resolution scanning transmission electron microscopy (STEM) combined with position-averaged convergent beam electron diffraction (PACBED) and energy dispersive X-ray spectroscopy (EDX) was utilized. 26,28,29 1c and Figure S8) reveal that La is uniformly substituted for the Hf host without segregation and that the doping concentration is ∼7% relative to the Hf.…”
Section: Ferroelectricity In Large-grain Csd-hlo Thin Film Onmentioning
confidence: 99%
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“…Xu, W. and LeBeau, J. M. demonstrated the capability of CNN to automatically analyze PACBED, incorporating parameters such as zero-order disk size, center position, rotation, and sample details like thickness and tilt [27]. Recently, Kim, Y. H. et al utilized a hybrid deep CNN, combining supervised and unsupervised components, to analyze SED-based PACBED patterns in polycrystalline Hf 0.5 Zn 0.5 O 2 films [28] (Figure 3c). Their study highlighted that deep learning can effectively extract crystallographic information from PACBED patterns, even though the patterns are averaged over a small area of only 2 nm 2 .…”
Section: Sed Using An Atomic-scale Electron Probementioning
confidence: 99%
“…To extract precise peaks, the signal-to-noise ratio is improved using the Wiener filter in the frequency domain, especially for periodic images [213] . Advanced techniques such as nonlocal means denoising [214] and block matching and three-dimensional filtering (BM3D) [215,216] have also been employed. Currently, a significant portion of image analysis through peak detection has been automated, and the processing speed has greatly improved, alleviating many challenges in the structural analysis of ferroelectrics [208] .…”
Section: Figure 14mentioning
confidence: 99%