2018
DOI: 10.1109/tcsii.2018.2827044
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Hybrid <inline-formula> <tex-math notation="LaTeX">${K}$ </tex-math> </inline-formula>-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images

Abstract: Hybrid K -means clustering and support vector machine method for via and metal line detections in delayered IC images

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Cited by 24 publications
(6 citation statements)
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“…Recently, Machine Learning (ML) and Deep Learning (DL) based approaches have gained increasing attention in image analysis for IC images [1]. Cheng et al [8] proposed a combined process using K-Means Clustering and Support As a result, the challenges in image analysis for IC images are largely addressed. However, recently proposed automation techniques stop at the standard cell recognition process.…”
Section: B Image Processing For Sem Imagesmentioning
confidence: 99%
See 1 more Smart Citation
“…Recently, Machine Learning (ML) and Deep Learning (DL) based approaches have gained increasing attention in image analysis for IC images [1]. Cheng et al [8] proposed a combined process using K-Means Clustering and Support As a result, the challenges in image analysis for IC images are largely addressed. However, recently proposed automation techniques stop at the standard cell recognition process.…”
Section: B Image Processing For Sem Imagesmentioning
confidence: 99%
“…Standard cell localization and recognition is the most important step because the reliable extraction of netlist from SEM images is a primary prerequisite for the success and accuracy of subsequent netlist analysis in the process of HA [4]- [7]. Localization of standard cells in SEM images has been well studied [8]- [10], however, standard cell recognition remains a challenging problem.…”
Section: Introductionmentioning
confidence: 99%
“…SVM is used for solving classification and regression tasks, primarily mapping data samples into a feature space through a kernel function and subsequently classifying them using hyperplane [17]. It is divided into kernel and simple SVM, which is commonly used for solving classification problems can be seen in Formula 6.…”
Section: K-nearest Neighbormentioning
confidence: 99%
“…For example, the authors of [11] published a fully convolutional network with VGG-16 encoder for segmentation of metal tracks and VIAs. In [4], the authors postulate an unsupervised K-means approach to the same task, but they acknowledge that this method is severely limited due to preparation shortcomings and image variations. The development of applied methods for counterfeit detection has yet been exclusively limited to package analyses [1], [6], [10].…”
Section: Related Workmentioning
confidence: 99%