2002
DOI: 10.1021/jp013246e
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Hydration of Passive Oxide Films on Aluminum

Abstract: Secondary ion mass spectrometry (SIMS) has been used in conjunction with isotopic labeling to determine the extent and rate of passive film hydration on aluminum. The rates at which oxygen- and hydrogen-containing species migrate through the film have been determined as a function of temperature and applied potential (cathodic and anodic polarization). The results suggest that defects such as hydroxide ions are prevalent and mobile in the oxide film, influencing the kinetics and mechanisms of corrosion and pit… Show more

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Cited by 210 publications
(171 citation statements)
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“…Using K = 10, E = 1 V/nm, and R = 150 nm, ρ e is found to be equivalent to approximately 0.007 % of the charge density due to O -2 ions. This small amount of charge may be accommodated by nonstoichiometry, especially since Al surface oxides in aqueous solutions contain appreciable quantities of hydrogen, at least some of which is in the form of mobile protons (21,22). Thus, mechanisms are likely available to adjust the space charge, in order to maintain the electric field distribution dictated by current continuity.…”
Section: Resultsmentioning
confidence: 99%
“…Using K = 10, E = 1 V/nm, and R = 150 nm, ρ e is found to be equivalent to approximately 0.007 % of the charge density due to O -2 ions. This small amount of charge may be accommodated by nonstoichiometry, especially since Al surface oxides in aqueous solutions contain appreciable quantities of hydrogen, at least some of which is in the form of mobile protons (21,22). Thus, mechanisms are likely available to adjust the space charge, in order to maintain the electric field distribution dictated by current continuity.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, this study considered repassivation to be induced by the precipitation of essentially bulk oxide species in the critical pit solution chemistry. The inclusion of the thermodynamics and kinetics of surface oxide precipitation 83,84 to inform the framework would provide more accurate estimates of the repassivation process. Such estimates would also facilitate the mechanistic validation of competitive adsorption models to describe repassivation.…”
Section: Discussionmentioning
confidence: 99%
“…3 shows the depth profiles of negative secondary ions for a typical 99.99 % Al sample, showing the major spectral peaks from the oxide film (AlO, O), the metal (Al, Al 2 ) and the deuterium-containing species (D, AlD). The time of 25 s corresponds to the decay of the AlO peak to half its maximum value, and to a sharp decrease of slope of the Al 2 signal; both of these features mark the oxide-metal interface (14,15). D and AlD peaks were very low or absent in mass spectra of as-electropolished samples, but were present in those of foils treated in NaOD.…”
Section: Methodsmentioning
confidence: 99%