1992
DOI: 10.1063/1.107516
|View full text |Cite
|
Sign up to set email alerts
|

Hydrodynamic analysis of submicrometer n+nn+ diodes for microwave generators

Abstract: We present a theoretical investigation on the electrical behavior of submicrometer n+nn+ diode microwave generators. To this end we adopt a mixed scheme which uses space-homogeneous and stationary Monte Carlo simulations to provide the input parameters for a hydrodynamic analysis of the diode performances. Comparison between GaAs and InP made devices working at 400 K give similar results by predicting generation frequencies up to 700 GHz for an active region length of 0.2 μm.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
8
0

Year Published

1993
1993
2020
2020

Publication Types

Select...
5
1

Relationship

2
4

Authors

Journals

citations
Cited by 17 publications
(8 citation statements)
references
References 13 publications
0
8
0
Order By: Relevance
“…The Gunn and IMPATT diodes which already work at frequencies of 100-200 GHz 2-4 can be considered as prototypes for this class of sources. To extend the power generation of these devices into the submillimeter and THz frequency range different possibilities have recently been proposed, including frequency mixing and multiplication in Schottky barrier diodes, 5 reduction of the transit time in deep submicron Gunn-oscillators, 6 resonant tunneling in double barrier heterostructures, 7 photon-assisted tunneling in resonant tunnelling diodes, 8 ballistic motion of carriers with negative effective-mass, 9 and various plasma instabilities. [10][11][12] However, in these devices an increase in the generation frequency is usually accompanied with both an increase in the required current density 4 and a decrease in the absolute value of the negative differential resistance.…”
Section: Introductionmentioning
confidence: 99%
“…The Gunn and IMPATT diodes which already work at frequencies of 100-200 GHz 2-4 can be considered as prototypes for this class of sources. To extend the power generation of these devices into the submillimeter and THz frequency range different possibilities have recently been proposed, including frequency mixing and multiplication in Schottky barrier diodes, 5 reduction of the transit time in deep submicron Gunn-oscillators, 6 resonant tunneling in double barrier heterostructures, 7 photon-assisted tunneling in resonant tunnelling diodes, 8 ballistic motion of carriers with negative effective-mass, 9 and various plasma instabilities. [10][11][12] However, in these devices an increase in the generation frequency is usually accompanied with both an increase in the required current density 4 and a decrease in the absolute value of the negative differential resistance.…”
Section: Introductionmentioning
confidence: 99%
“…E ext is the external THz radiation expressed as E ext (t) = V ac cos(2π f ac t)/l, with ac intensity V ac and frequency f ac . We apply the hydrodynamic equations [20][21][22][23][24][25] to study the nonlinear dynamics in the In 0.53 Ga 0.47 As diode…”
Section: Hydrodynamic Simulation Of Chaotic Dynamics In Ingaas Thz Os...mentioning
confidence: 99%
“…Any small doping inhomogeneity in the NDV region can lead to the formation of domain and oscillations. [20] We assume that there is a slight doping fluctuation near each end of the diode. This fluctuation results in the formation of electric field domain and hence current oscillation.…”
Section: Hydrodynamic Simulation Of Chaotic Dynamics In Ingaas Thz Os...mentioning
confidence: 99%
“…͑2͒-͑5͒ form a closed system of deterministic equations suitable for the numerical modeling of unipolar carrier transport in semiconductor devices under current operation mode. 8 In the opposite case of voltage operation mode an additional equation for the voltage drop between the structure terminals U(t) must be added: 8…”
mentioning
confidence: 99%
“…Furthermore, the same approach has been proved to describe satisfactorily both static and dynamic characteristics of the whole structure even when inside the active n-region carrier ballistic transport occurs at the characteristic scales of the order of, or even less than, the carrier mean-free path. [7][8][9][10] To account for fluctuations associated with single scattering events occurring at point x 0 and time t 0 of the device under test, the random impulsive force for such an event can be represented as…”
mentioning
confidence: 99%