2013
DOI: 10.1016/j.tsf.2013.07.039
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Hydrogen-induced blistering of Mo/Si multilayers: Uptake and distribution

Abstract: We report on the uptake of deuterium by thin-film Mo/Si multilayer samples as a result of exposure to fluxes of predominantly thermal atomic and molecular species, but also containing a small fraction of energetic (800-1000 eV) ions. These exposures result in blister formation characterized by layer detachment occurring exclusively in the vicinity of the Mo-on-Si interfaces.This localization is attributed to strained centres introduced within the interfacial region during silicide formation and subsequent Mo c… Show more

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Cited by 16 publications
(13 citation statements)
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“…The Mo/Si ML samples investigated in this work are similar to those studied previously [23][24][25][26] . They were deposited on a super-polished Si wafer by magnetron sputtering with additional ion polishing of the deposited Si layers.…”
Section: Methodssupporting
confidence: 64%
See 1 more Smart Citation
“…The Mo/Si ML samples investigated in this work are similar to those studied previously [23][24][25][26] . They were deposited on a super-polished Si wafer by magnetron sputtering with additional ion polishing of the deposited Si layers.…”
Section: Methodssupporting
confidence: 64%
“…These samples are composed of alternating layers of nanometer thick amorphous Si (a-Si) and polycrystalline Mo with mixed Mo-Si interfacial regions 22 . They are susceptible to two distinct hydrogen-induced blistering processes [23][24][25][26] , which are attributed to the formation of H2-filled blisters and to the formation and clustering of hydrogen-vacancy complexes producing void blister 24 . The former occurs under the influence of thermal H-atom irradiation; the latter process is observed when energetic (100's of eV) ions are present in the irradiating flux.…”
Section: Introductionmentioning
confidence: 99%
“…The current work expands on earlier reports [26,54,55] by focusing on the specific roles that energetic ions play in inducing and modifying blistering of Mo/Si MLs. These ions are an incidental consequence of the mode of operation of the particle source and have energies in the 800-1000 eV range.…”
Section: Incorporation Of Additional Atoms Resulted In H 2 Formationmentioning
confidence: 69%
“…The ability of defects introduced in materials by ion irradiation to accumulate hydrogen is well-established. However, while induced defects and implantation will occur across the entire region probed by the penetrating ions, blister formation remains localized in the vicinity of the Mo-on-Si interfaces [26,54]. Thus local structural properties are the determining factor in blister manifestation, with the Mo-on-Si interface clearly providing the preferred nucleation sites.…”
Section: The Appearance Of the "Ion-induced" Distributionmentioning
confidence: 99%
“…Similar results were reported also in Refs. [132,133]. However, these effects seem to be dependent on the material used for the capping-layer: in this experiment, all the Ir-capped ML showed a smaller reflectance loss and a shorter peak shift than the structures with other capping-layers.…”
Section: Stability To Accelerated Ions Implantationmentioning
confidence: 62%