Hydrogen ion desorption from amorphous carbon films induced by resonant core electron excitations

Mera, Yutaka; Liang, Shanshan; Fujiwara, Takayuki; Ishizaki, Kiichiro; Kakiuchi, Takuhiro; Mase, Kenji; Kobayashi, Eiichi; Okudaira, Koji K.; Maeda, Koji

doi:10.1016/j.nimb.2009.10.172

Search citation statements

Order By: Relevance

Paper Sections

Select...

The Mechanism Of the Resonant Effect1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2011

Publication Types

Select...

Other1

Relationship

Self Cite1

Independent0

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 21 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…To examine these hypotheses, we conducted TOF measurements of photo-desorbed species at KEK-PF [25,26]. The ta-C sample we used was basically the same as that used for illumination experiments at SPring-8.…”

Section: The Mechanism Of the Resonant Effectmentioning

confidence: 99%

Structural change induced in carbon materials by electronic excitations

et al. 2011

Self Cite

View full text Add to dashboard Cite

Intense soft X-ray illumination near the carbon core edge induces significant structural damage in tetrahedral amorphous carbon films and less significant but detectable defect formation in single-walled carbon nanotubes (SWNTs). The efficiency spectra of the photo-induced damage commonly show a resonant peak between the π * and σ * peaks of X-ray absorption spectra in addition to a non-resonant background. The resonant damage cannot be explained by the coreexciton mechanism but can be attributed to a recoil damage accompanying the photo-desorption of heavy chemisorbates that is resonantly decomposed by the spectator Auger mechanism. The cause of the non-resonant damage in SWNTs may be attributed to anomalous radiation damage by low-energy electrons generated by secondary effects of soft X-ray illumination, which is supported by the recent finding by authors that hot electron injection from probe tips of scanning tunneling microscopes generates defects in the SWNT samples.

show abstract

Section: The Mechanism Of the Resonant Effectmentioning

confidence: 99%