Hydrogenated amorphous silicon on soda-lime glass substrate: Correlation between sodium contamination and porosity of the films

Pantchev, B.; Danesh, P.

doi:10.1080/01418619508236260

Philosophical Magazine A

1995

DOI: 10.1080/01418619508236260

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Hydrogenated amorphous silicon on soda-lime glass substrate: Correlation between sodium contamination and porosity of the films

B. Pantchev

P. Danesh

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1997

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Changes in electrical conductance of hydrogenated amorphous silicon deposited on optical waveguides in glass

Danesh

Pantchev

1997

Applied Physics Letters

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A study of electrical conductance of hydrogenated amorphous silicon (a-Si:H) films deposited on optical waveguides in a soda-lime glass (SLG) substrate is carried out, from the viewpoint of electrical instability of a-Si:H caused by the penetration of Na ions from the glass into the film. The optical waveguides were prepared by K+–Na+ or Ag+–Na+ ion exchange using thermal or field-assisted methods. The effective thickness of optical waveguides was of several micrometers. The obtained results show that in the case of a-Si:H film deposited on silver waveguide there is a dependence of electrical conductance on measurement duration, if strongly weakened as compared with film deposited on the original SLG substrate. The a-Si:H films deposited on potassium waveguide and on Na-extracted surface are as stable, as the referent samples with Corning 7059 (Na-free) glass substrate.

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Changes in electrical conductance of hydrogenated amorphous silicon deposited on optical waveguides in glass

Danesh

Pantchev

1997

Applied Physics Letters

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Hydrogenated amorphous silicon on soda-lime glass substrate: Correlation between sodium contamination and porosity of the films

Cited by 1 publication

References 11 publications

Changes in electrical conductance of hydrogenated amorphous silicon deposited on optical waveguides in glass

Changes in electrical conductance of hydrogenated amorphous silicon deposited on optical waveguides in glass

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