“…The characteristic X-ray of each element in a sample is analyzed by energy-dispersive X-ray spectrometry (EDS). SXAMs have been utilized for analyses of major and trace elements in a wide range of geological materials, including compositional banding in sediments and sedimentary rocks (Koshikawa et al, 2003;Kido et al, 2006;Böning et al, 2007;Katsuta et al, 2007aKatsuta et al, , 2007bYoshida et al, 2007;Baioumy et al, 2011), in igneous rocks (Michibayashi et al, 1999(Michibayashi et al, , 2002Yoshida et al, 2009;Harigane and Michibayashi, 2012), in metasediments (Katsuta et al, 2012), and in weathering and alteration rinds (Kuriyama et al, 2006;Nishimoto and Yoshida, 2010). These studies have successfully imaged the compositional gradients at centimeter scales (e.g., Kuriyama et al, 2006) and identified spatial distributions of minerals (e.g., Togami et al, 2000;Michibayashi et al, 2002).…”