“…The baseline for all XRD patterns was elevated in the 2θ range of 5−15°, presumably owing to scattered X-rays originating from the apparatus used, as observed in our previous studies analyzing a variety of materials with the same diffractom-eter. [32][33][34]36 Milling triggered the amorphization of fluoritetype CeO 2 (see XRD pattern for ball-milled mixture of SiO 2 and CeO 2 •nH 2 O in Figure 2A), as evidenced by the disappearance of the diffraction peaks observed prior to milling. Instead, in agreement with our previous reports, small diffraction peaks, attributable to a slight β-Si 3 N 4 contamination from the pot and balls used for pulverization, were observed at 2θ values of 13.4, 23.4, 27.0, 33.7, 36.0, 41.4, and 52.1°.…”