Scanning tunnelling microscopes can be used to detect transitions between
reversible and irreversible deformations of materials. Since the occurrence of
stress-strain hysteresis is a necessary condition for the generation of
material defects, and the cumulation of defects is, in turn, the underlying
cause of fatigue failure, the observation of non-hysteretic reversible
deformations extending over many atomic lengths implies that mechanical
nanoscale devices are potentially capable of having service lives of extremely
long duration.