Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9)
DOI: 10.1109/pvsc.1993.347153
|View full text |Cite
|
Sign up to set email alerts
|

I-III-VI/sub 2/ multinary solar cells based on CuInSe/sub 2/

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
26
0

Publication Types

Select...
5
4

Relationship

1
8

Authors

Journals

citations
Cited by 24 publications
(26 citation statements)
references
References 2 publications
0
26
0
Order By: Relevance
“…It has also been shown that the addition of elements such as Ga and sulfUr may fbrther extend the compositional range over which good PV performance results. [22,29] We have demonstrated deposition processes which evidence a very wide process window in terms of composition. For example, small area devices having a Cu/(In+Ga) ratio of 0.90 and 0.75 showed AM13 efficiencies of 10.8% and 11.5% respectively.…”
Section: Robustness and Process Tolerance Of Variabilitymentioning
confidence: 98%
See 1 more Smart Citation
“…It has also been shown that the addition of elements such as Ga and sulfUr may fbrther extend the compositional range over which good PV performance results. [22,29] We have demonstrated deposition processes which evidence a very wide process window in terms of composition. For example, small area devices having a Cu/(In+Ga) ratio of 0.90 and 0.75 showed AM13 efficiencies of 10.8% and 11.5% respectively.…”
Section: Robustness and Process Tolerance Of Variabilitymentioning
confidence: 98%
“…This problem was attacked and greatly reduced through modifkitions to the scribing processes and the associated contacting layers. This program also allowed development and scale-up of processes for the deposition of all other substrate, heterojunction buffer, and window layers and associated scribinglmodule formation operations to Cross-section scanning electron micrographs of CIGS films deposited using various methods Compositional uniformity of absorber layer over a 9" x 9" area Uniformity of device performance over a 3" substrate Uniformity of average device performance over eight 3"x3" substrates Frequency histogram of device performance on eight 3"x3" substrates Absorber layer composition for six consecutive depositions Device J-V parameters for six consecutive absorber layer depositions Measurement of J-V characteristic of a module segment either through a top grid or an interconnect A scanning electron micrograph and schematic view of step coverage of ZnO at an interconnect An optical micrograph of a defective substrate scribe An optical micrograph of a high quality substrate scribe 29 The light J-V characteristic ofthe highest efficiency small area cell 32 The dark J-V characteristic of the highest efficiency small area cell 33 A schematic representation of the circuit used for module analysis 35 Calculated and measured J-V data for a module segment using 36 various segment widths, fiont contact and interconnect resistivities The calculated module efficiency using 18 or 12 mil interconnects 37 The calculated module efficiency uSig 6 or 0 mil interconnects 38…”
mentioning
confidence: 99%
“…Elemental profiles typical of the SSI graded absorber structures are presented in Figure 4. Efficiency, voltage and adhesion improvements have been reported for the SSI graded absorber structure (2,15,16). This graded absorber structure is distinct from an absorber structure with a nearly uniform gallium or sulfur concentration throughout the absorber, although both types of structure may improve device efficiency.…”
Section: Ssi Cis Processmentioning
confidence: 98%
“…Elemental profiles typical of the SSI graded absorber structures are presented in Figure 6. Efficiency, voltage, and adhesion improvements have been demonstrated for the SSI graded absorber structure [10,11]. Figure 7 illustrates the module configuration used for prototypes and products during this subcontract.…”
Section: Ssi Cis Processmentioning
confidence: 99%