2002
DOI: 10.1063/1.1451889
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In situ magnetoresistance measurements during patterning of spin valve devices

Abstract: This dissertation describes an experimental study on the patterning of thin films and spin valve devices. Initially the change in the magnetisation reversal of ferromagnetic Ni 80 Fe 15 Mo 5 thin films was investigated as the shape anisotropy was increased using optical lithography to pattern wire arrays. These structures show a progressive increase in coercivity and a transition between single and two-stage reversal with increasing milling depth. A similar patterning technique was applied to unpinned (Ni 80 F… Show more

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Cited by 5 publications
(3 citation statements)
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References 36 publications
(30 reference statements)
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“…8 Details of the set-up can be found elsewhere. 9 The plane of the sample was oriented to be perpendicular to the incident ion angle, which optimized the cross section of the wire pattern. Great care was taken to avoid milling the NiFe/ Cu/ NiFe trilayer beneath the AFM layer.…”
Section: Methodsmentioning
confidence: 99%
“…8 Details of the set-up can be found elsewhere. 9 The plane of the sample was oriented to be perpendicular to the incident ion angle, which optimized the cross section of the wire pattern. Great care was taken to avoid milling the NiFe/ Cu/ NiFe trilayer beneath the AFM layer.…”
Section: Methodsmentioning
confidence: 99%
“…Experimentally a large variation in magnitude of the BMR, and a wide range in the conductance occur during BMR peaks. Spin-ballistic transport through the nanocontact is reported to be responsible for BMR effects in different regimes [4,5]. The behavior is determined by the spin-scattering at the domain wall and is controlled by only the domain wall thickness.…”
Section: Introductionmentioning
confidence: 98%
“…In one approach prestructured samples are fine-tuned via conventional nonspatially resolving Ar ion milling and MR investigations are performed in the same vacuum system. 15 In a second approach, 16 the sample is transferred under vacuum from a low energy ion milling stage to the measurement stage. Both methods are good but time consuming when systematic studies require frequent sample exchange.…”
Section: Introductionmentioning
confidence: 99%