In situ transmission electron microscopy for magnetic nanostructures

Abstract

Nanomagnetism is a subject of great interest because of both application and fundamental aspects in which understanding of the physical and electromagnetic structure of magnetic nanostructures is essential to explore the magnetic properties. Transmission electron microscopy (TEM) is a powerful tool that allows understanding of both physical structure and micromagnetic structure of the thin samples at nanoscale. Among TEM techniques, in situ TEM is the state-of-the-art approach for imaging such structures in dynamic experiments, reconstructing a real-time nanoscale picture of the properties–structure correlation. This paper aims at reviewing and discussing in situ TEM magnetic imaging studies, including Lorentz microscopy and electron holography in TEM, applied to the research of magnetic nanostructures.

Visualizing quantum phenomena at complex oxide interfaces: An atomic view from scanning transmission electron microscopy

“…Lorentz TEM [108,109], electron holography [110,111], 4-D STEM / differential phase contrast (DPC)-STEM [112,113], and electron energy-loss magnetic chiral dichroism (EMCD) [112][113][114] represent the state-of-the-art techniques to detect magnetic textures in complex materials. Lorentz TEM has been employed directly to resolve the skyrmion spin texture in Fe0.5Co0.5Si thin films [117] and studied magnetic transition from stripe to bubble state in PbFe12O19 [112].…”

Aharonov–Bohm‐inspired tomographic imaging via compressive sensing

“…The implemented compressive sensing algorithms, in the proposed technique, are also state-of-the-art and more efficient than the ones employed in [20]. It should be stressed that transmission electron microscopes were used to measure the magnetic phase shift of electron waves in order to reconstruct the magnetic vector potential [21,20], or the full electromagnetic field [22,23] produced by various media [19,24,25] and magnetic structures [26]; however, the presented technique is significantly different compared with all of them. In addition, contrary to electron tomography, for which the measurable quantum phenomena of the electromagnetic potentials are a nuisance, here we directly exploit these effects.…”

Exploring characteristics of the corner sections of a domain wall trap nanostructure with the two-field direction method

“…14 This tilting eld method is available in the modied eld emission gun LTEM (FEG LTEM-CM20). 18,29,30 This technique might provide a DW propagation eld range for each DWT corner, i.e. particularly at the trap curvatures linking the horizontal nanowires and the vertical ones, denoted as the 1st and 2nd nanowires, and the 1st, 2nd and 3rd legs, respectively.…”