In situ X-ray area detector flat-field correction at an operating photon energy without flat illumination

Abstract

Flat-field calibration of X-ray area detectors is a challenge due to the inability to generate an X-ray flat-field at the selected photon energy the beamline operates at, which has a strong influence on the measurement behavior of the detector. A method is presented in which a simulated flat-field correction is calculated without flat-field measurements. Instead, a series of quick scattering measurements from an amorphous scatterer is used to calculate a flat-field response. The ability to rapidly obtain a flat-field response allows for recalibration of an X-ray detector as needed without significant expenditure of either time or effort. Area detectors on the beamlines used, such as the Pilatus 2M CdTe, PE XRD1621 and Varex XRD 4343CT, were found to have detector responses that drift slightly over timescales of several weeks or after exposure to high photon flux, suggesting the need to more frequently recalibrate with a new flat-field correction map.