We combine diffraction and absorption tomography by raster scanning samples through a hollow cone of pseudo monochromatic X-rays with a mean energy of 58.4 keV. A single image intensifier takes 90x90 (x,y) snapshots during the scan. We demonstrate a proofof-principle of our technique using a heterogeneous three-dimensional (x,y,z) phantom (90x90x170 mm 3 ) comprised of different material phases, i.e., copper and sodium chlorate. Each snapshot enables the simultaneous measurement of absorption contrast and diffracted flux. The axial resolution was ~1 mm along the (x,y) orthogonal scan directions and ~7 mm along the z-axis. The tomosynthesis of diffracted flux measurements enable the calculation of d-spacing values with ~0.1 Å full width at half maximum (FWHM) at ~2 Å. Thus the identified materials may be color-coded in the absorption optical sections. Characterization of specific material phases is of particular interest in security screening for the identification of narcotics and a wide range of homemade explosives concealed within complex "everyday objects." Other potential application areas include process control and biological imaging.
IntroductionRadiographic imaging and the structural analysis of materials using X-rays developed disparately soon after the discovery of X-rays in 1895 [1]. The former has evolved from simple planar imaging into sophisticated tomographic methods [2,3], while the latter formed the basis of X-ray crystallography. Each approach demands quite different spatiotemporal collection and sensing requirements [4,5]. In general, incident X-rays composing a spatial image propagate along a linear path from the source to the detector and do not interact with the materials under inspection. However, the spectroscopic analysis of the transmitted X-rays may provide some useful materials discrimination information [6]. Ultimately, such approaches are limited fundamentally and cannot provide structural or 'molecular resolution' analysis. In contrast, determination of the atomic and molecular structure of crystalline/polycrystalline materials requires analysis of coherently scattered or diffracted Xrays from a sample. The relatively low energy of the interrogating radiation used in laboratory X-ray diffraction (XRD) limits penetration into the sample to near the incident surface. Significantly higher X-ray energies are required (i.e. an order of magnitude increase in photon energy over the legacy 8 keV Cu Kα [7]) for transmission mode diffraction for highly absorbing and or extended thickness samples [7][8][9]. Conventional fan beam tomography has provided diffracted flux measurements [5,[9][10][11] to demonstrate spatially-resolved material specific profiles. Novel compressive tomography promises further reductions in scan times and exposure [12][13][14]. The common problem confronting all volumetric XRD scanning/imaging methods is the production and measurement of sufficient diffracted flux or signal photons to provide the desired scan speed at application dependent energies. These consideration...