2013
DOI: 10.1063/1.4827379
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p-type conduction from Sb-doped ZnO thin films grown by dual ion beam sputtering in the absence of oxygen ambient

Abstract: Sb-doped ZnO (SZO) thin films were deposited on c-plane sapphire substrates by dual ion beam sputtering deposition system in the absence of oxygen ambient. The electrical, structural, morphological, and elemental properties of SZO thin films were studied for films grown at different substrate temperatures ranging from 200 °C to 600 °C and then annealed in situ at 800 °C under vacuum (pressure ∼5 × 10−8 mbar). Films grown for temperature range of 200–500 °C showed p-type conduction with hole concentration of 1.… Show more

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Cited by 36 publications
(8 citation statements)
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“…This method produces thin films with growth uniformity, reduced surface roughness and adhesion to the substrate even for films grown at room temperature. It is widely used for growth of ZnO and MgZnO films for optoelectronic device applications [20][21][22][23], TiO 2 , Ta 2 O 5 , ZrO 2 и SiO 2 thin films for optical coatings [24,25], VO 2 films for microbolometer uncooled IR sensors [26] and so on. In IBSD the oxide composition can be easily set by adjusting the O 2 partial pressure [27] in contrast to the ALD method wherein a reduction in the oxidant concentration increases carbon impurities in the film.…”
Section: Introductionmentioning
confidence: 99%
“…This method produces thin films with growth uniformity, reduced surface roughness and adhesion to the substrate even for films grown at room temperature. It is widely used for growth of ZnO and MgZnO films for optoelectronic device applications [20][21][22][23], TiO 2 , Ta 2 O 5 , ZrO 2 и SiO 2 thin films for optical coatings [24,25], VO 2 films for microbolometer uncooled IR sensors [26] and so on. In IBSD the oxide composition can be easily set by adjusting the O 2 partial pressure [27] in contrast to the ALD method wherein a reduction in the oxidant concentration increases carbon impurities in the film.…”
Section: Introductionmentioning
confidence: 99%
“…A working electrode of GZO with a thickness of 150 nm on p‐Si (111) was generated by means of dual ion beam sputtering deposition (DIBSD) technique. The detailed growth procedure with the DIBSD system was described elsewhere …”
Section: Methodsmentioning
confidence: 99%
“…Pandey et al 84 fabricated p-ZnO:Sb by dual ion beam sputtering. This technique can produce high-quality films with a relatively superior constituent stoichiometry, uniformity, and adhesion to the substrate.…”
Section: Ways To Improve Mobilitymentioning
confidence: 99%