For transverse isotropy with a vertical symmetry axis (VTI media), P‐wave reflection data alone are insufficient for building velocity models in depth. Here, we show that all parameters of VTI media responsible for propagation of P‐ and SV‐waves (the P‐wave and S‐wave vertical velocities VP0 and VS0 and the anisotropic parameters ε and δ) can be obtained by combining P‐wave traveltimes with the moveout of PS‐waves converted at a horizontal and dipping interface. Using converted modes, rather than pure S‐waves, avoids the need for expensive shear‐wave excitation on land and makes the method suitable for offshore exploration.
The inversion algorithm is based on a new analytic description of the dip moveout of PS‐waves developed for symmetry planes of anisotropic media (and for any vertical plane in models with weak azimuthal anisotropy). The common‐midpoint (CMP) traveltime–offset relationship, derived in a parametric form and represented through the components of the slowness vector of the P‐ and S‐waves, makes it possible to compute the moveout curve of the PS‐wave without two‐point ray tracing. This formalism also leads to closed‐form solutions for moveout attributes, such as the coordinates (xmin, tmin) of the traveltime minimum, the normal‐moveout (NMO) velocity defined at x = xmin and the slope of the moveout curve (apparent slowness) at zero offset.
The parameter‐estimation algorithm operates with reflection moveout of P‐ and PS‐waves from a horizontal and dipping reflector. The NMO velocities of P‐ and PS‐waves from horizontal events and the ratio of the corresponding zero‐offset traveltimes yield three equations for the four unknown medium parameters. The remaining parameter is found from an overdetermined system of equations that includes the P‐wave NMO velocity and moveout attributes of the PS‐wave for a dipping event. Numerical analysis shows that the PS‐wave dip‐moveout signature plays a crucial role in obtaining accurate estimates of the anisotropic parameters. The joint inversion of P and PS data provides the necessary information not only for P‐wave depth imaging in VTI media, but also for the processing of PS‐waves, including re‐sorting of PS traces into common‐reflection‐point gathers and transformation to zero offset (TZO).