2016 IEEE International Test Conference (ITC) 2016
DOI: 10.1109/test.2016.7805858
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I-Q signal generation techniques for communication IC testing and ATE systems

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Cited by 18 publications
(6 citation statements)
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“…We developed various DWA algorithms: Muti-BP ΔΣ ADC DWA algorithms [92], Second-order LP DWA algorithms [93,94], Complex single-BP DWA algorithm [87], Complex multi-BP DWA algorithms [95], DWA algorithms for BP ΔΣ DAC with ternary unit cells [96], DWA and self-calibration algorithms of multi-bit ΔΣ TDC [97,98].…”
Section: Dynamic Element Matching Technologiesmentioning
confidence: 99%
See 1 more Smart Citation
“…We developed various DWA algorithms: Muti-BP ΔΣ ADC DWA algorithms [92], Second-order LP DWA algorithms [93,94], Complex single-BP DWA algorithm [87], Complex multi-BP DWA algorithms [95], DWA algorithms for BP ΔΣ DAC with ternary unit cells [96], DWA and self-calibration algorithms of multi-bit ΔΣ TDC [97,98].…”
Section: Dynamic Element Matching Technologiesmentioning
confidence: 99%
“…(ii) Two DACs are used in a complex BP modulator and its DWA algorithm utilizes cross-coupled order selection of unit cells in two DACs (Fig. 35) [87,95].…”
Section: Dynamic Element Matching Technologiesmentioning
confidence: 99%
“…However, in modern wireless communication, IQ signal modulation is standard. IQ signal is also called quadrature signal in the same direction [4]. I by in-phase(in-phase), Q by quadrature(orthogonal), and the phase difference between Q and I is 90 degrees.…”
Section: Introductionmentioning
confidence: 99%
“…Notice that for their generation in the audio frequency band, the benchtop audio analyzer (Audio Precision APx555B) is the industry standard and its total harmonics distortion and noise (THD+N) is less than −120 dB. Also notice that there are many technologies for high quality generation of such as multi-tone signals besides the sine signal in analog device testing systems [20,21,22,23,24,25,26,27,28,29]. We show here the proposed method is especially suitable for low-cost high-quality testing of analog devices.…”
Section: Introductionmentioning
confidence: 99%