I_DDX-based test methods

Abstract

Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (I DDQ ) and transient current (I DDT ) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively these test methods are known as I DDX tests. However, due to advances in the semiconductor manufacturing process, the future of these test methods is uncertain. This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies.

A Unified Framework for Multimodal Submodular Integrated Circuits Trojan Detection

“…The leakage current can be measured via the commonly known IDDQ test methods often done via the off-chip pins by the precision measurement unit (PMU) [18]. The dynamic current tests are referred to as IDDT tests that can be done by averaging methods that do not require high precision or high frequency measurement devices [16].…”

“…Our Trojan detection method attempts at finding the current deviation at the gate-level where the Trojan impact modifies a set of gate currents. The mechanisms for testing all the gates' states are similar to the bridging/leakage fault testing [18].…”

“…A comprehensive survey of IDDT and IDDQ testing techniques can be found in [18]. In this work, we use available methods for test vector generation for current-based tests [19].…”

A Unified Submodular Framework for Multimodal IC Trojan Detection

“…We use the testing pattern generation method described in [29].The leakage current can be measured via the commonly known IDDQ test methods, where IDDQ refers to the measurement of the quiescent power-supply current. The IDDQ tests are often done via the off-chip pins by the precision measurement unit (PMU) [26]. The dynamic current tests are referred to as IDDT tests.…”

Test Based on Built-In Current Sensors for Mixed-Signal Circuits

“…A survey of I DD test methodologies, both quiescent and transient, can be found in [2]. All of them require precise measurements to be effective.…”