2022
DOI: 10.1109/led.2022.3192178
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β-Ga2O3-Based Solar-Blind Photodetector With Ultrahigh Responsivity via Optimizing Interdigital Electrode Parameters

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Cited by 24 publications
(11 citation statements)
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“…Two steep absorption edges are observed around 255 nm and 360 nm, from which the optical bandgap of GaN and Ga 2 O 3 films are deduced to be ≈3.4 eV and ≈4.8 eV by Tauc's formulation. [ 27 ] SIMS elemental mappings of O (green) and N (blue) components over the same area show the successful fabrication of N‐doped βGa 2 O 3 films on GaN substrates, as indicated in Figure 1d.…”
Section: Resultsmentioning
confidence: 92%
“…Two steep absorption edges are observed around 255 nm and 360 nm, from which the optical bandgap of GaN and Ga 2 O 3 films are deduced to be ≈3.4 eV and ≈4.8 eV by Tauc's formulation. [ 27 ] SIMS elemental mappings of O (green) and N (blue) components over the same area show the successful fabrication of N‐doped βGa 2 O 3 films on GaN substrates, as indicated in Figure 1d.…”
Section: Resultsmentioning
confidence: 92%
“…Under 0 V bias, the specific detectivity of devices with HTL can reach 2.20 × 10 12 Jones. As shown in Figure b, the rise time and fall time of the device (defined as the transition time between the 10 and 90% levels) are improved from 2.91 to 0.83 μs and from 3.01 to 0.71 μs, so the response speed is faster than those of the Sb 2 S 3 PDs without the HTL. Table lists some nanowire-structured Sb 2 S 3 detectors and other detectors used for VLC, and we can observe that the device designed in this article has high responsiveness and can be better applied to VLC.…”
Section: Resultsmentioning
confidence: 93%
“…It is obvious that the NWs overlay on the electrodes. From the previous report, the dark current and photocurrent approximately linearly vary with the length and width of interdigital electrodes, which is caused by a rise of illumination area resulting in more carriers being collected. On the contrary, the currents decrease as the gap increases, which is attributed to the reduced intensity of the electric field and the slower carrier drift velocity caused by the increased gap.…”
Section: Methodsmentioning
confidence: 84%