We report the results of DLTS experiments under uniaxial stress on the second ionization level of EL2(++/+) in p-type GaAs. We measured the shift in the hole emission rate as a function of stress applied in the [100] and [110] directions. By modeling the valence band with two independently displacing bands and appropriately derived effective masses, we obtain a small absolute hydrostatic pressure derivative for the defect, 39 ±15 meV GPa-1. The shear contribution is negligible. This result is very different than for the first ionization level, EL2(+/o) with a emission energy pressure derivative of 90 ±15 meV GPa-1. The difference can be accounted for by the pressure dependence of the electron capture barrier of EL2(+/o), 49 ±15meV GPa-1. The absolute pressure derivatives of the two levels are then comparable and in good agreement with simple theory for Ga site point defects.