2016
DOI: 10.1002/pssr.201600008
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Identification of grain boundaries as degradation site in n-channel organic field-effect transistors determined via conductive atomic force microscopy

Abstract: 1 Introduction Polycrystalline organic thin-film field-effect transistors (OFETs) have been an important topic of interest in different scientific fields in the past years [1]. Electronic devices based on organic semiconductors have great potential for use in novel electronic devices due to their mechanical flexibility and low cost production. These properties make organic semiconductors a good candidate in a wide range of electronic applications, such as sensors [2], radio-frequency identification (RFID) tags… Show more

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Cited by 10 publications
(13 citation statements)
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References 27 publications
(33 reference statements)
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“…[41] As mentioned above, threshold voltage shifts ∆V th originate from trapped charges, either in the bulk of the semiconductor, at the semiconductor-dielectric interface, or at grain boundaries. [72,73] Consequently, the stability of the threshold voltage depends on the individual materials in the OFET as well on the interfaces and the processing. Furthermore, additional trap states might be formed by external impurities such as water and oxygen, similar as discussed for the PLEDs.…”
Section: Performance and Stability Of Polymer Fetsmentioning
confidence: 99%
“…[41] As mentioned above, threshold voltage shifts ∆V th originate from trapped charges, either in the bulk of the semiconductor, at the semiconductor-dielectric interface, or at grain boundaries. [72,73] Consequently, the stability of the threshold voltage depends on the individual materials in the OFET as well on the interfaces and the processing. Furthermore, additional trap states might be formed by external impurities such as water and oxygen, similar as discussed for the PLEDs.…”
Section: Performance and Stability Of Polymer Fetsmentioning
confidence: 99%
“…It is therefore important to understand the implications of grain boundaries in small molecular thin films on charge transport. In realistic thin film transistors, grain boundaries can dominate charge transport, since they can act as traps for charges thus reducing the charge carrier mobility 33 , 34 , lead to increased bias stress 35 , 36 or lower long-term electrical stability 37 , 38 . Additionally, the impact of grain boundaries seems to be especially strong if the semiconductor is only one monolayer thin 29 .…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4][5][6][7][8][9][10][11][12] Utilizing OFETs as light sensors is of interest as the active organic layer can be tailored to absorb photons of specific energy which when combined with the gain offered by the transistor can result in a highly sensitive device. [13][14][15][16][17][18][19] Recently, polymer-based organic photosensitive transistors (OPTs) have been demonstrated, opening the possibility to print these devices on flexible substrates, leading to flexible optoelectronic systems. [20][21][22] Previously, it was reported by Narayan and Kumar that poly(3-octylthiophene)-based OPTs demonstrated a photosensitivity (P) of 10 2 and a responsivity (R) of 1 A W À1 at a wavelength of 525 nm.…”
Section: Introductionmentioning
confidence: 99%