Identification of high power consuming areas with gate type and logic level information

Abstract

Power-related problems in at-speed scan testing have become more and more serious, since excessive IRdrop caused by excessive power consumption results in overtesting. There are two important factors in low-power testing: one is power estimation, the other is power reduction. Several estimation methods have been proposed based on the analysis of switching activity characteristics. In order to estimate the impact of IR-drop, it is more important to consider the area containing many cells which consume excessive power than to consider the total number of switching activity in a circuit. In this paper, we propose a novel method for identifying areas where excessive IR-drop likely occurs without using test vectors. Visualized experimental results for IWLS 2005 benchmark circuits demonstrate that the proposed method can effectively identify areas containing many cells which consume higher power than others. Such areas identified can be used in lowpower test generation so as to achieve effective and efficient results.

On‐chip generation of primary input sequences for multicycle functional broadside tests

“…Other types of tests that attempt to achieve close-to-functional operation conditions are described in [10][11][12][13]. In addition, low-power test generation procedures that attempt to maintain a functional level of power dissipation are described in [14][15][16][17].…”