2004
DOI: 10.1109/tmag.2004.825322
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Identification of Multiple Cracks from Eddy-Current Testing Signals With Noise Sources by Image Processing and Inverse Analysis

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Cited by 22 publications
(4 citation statements)
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“…Additionally, multiple pancake probes can be fabricated to compose an array with a flexible arrangement of coils and different operation modes [7][8][9]. Furthermore, cracks can be quantitatively evaluated using the arrayed probe [10].…”
Section: Introductionmentioning
confidence: 99%
“…Additionally, multiple pancake probes can be fabricated to compose an array with a flexible arrangement of coils and different operation modes [7][8][9]. Furthermore, cracks can be quantitatively evaluated using the arrayed probe [10].…”
Section: Introductionmentioning
confidence: 99%
“…In the NDT and evaluation community, several methods for solving the inverse problem by using the detection step have been applied. In Nagaya et al (2004), the authors use image processing and genetics algorithms for identifying the number and positions of cracks and reconstructing crack shapes. A support vector machine-based algorithm is used for defect detection, location and characterization (Bernieri et al, 2006).…”
Section: Discussionmentioning
confidence: 99%
“…The receiver coil is located between the two exciting coils. The purpose of this design is to reduce or eliminate background signals and increase the sensitivity to anomalies [2,18]. The system provides fast, reliable data transfer by taking advantage of the Ethernet communication.…”
Section: Methodsmentioning
confidence: 99%