2009
DOI: 10.1088/1674-1137/33/2/015
|View full text |Cite
|
Sign up to set email alerts
|

Identification of pore size in porous SiO 2 thin film by positron annihilation

Abstract: Identification of pore size in porous SiO 2 thin f ilm by positron annihilationWANG Qiao-Zhan( ) 1 MA Yan-Yun( ) 3 WANG Bao-Yi( ) 1;1)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2012
2012
2014
2014

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 14 publications
0
0
0
Order By: Relevance