2017
DOI: 10.1103/physrevb.96.161114
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Identification of Si-vacancy related room-temperature qubits in 4H silicon carbide

Abstract: The identification of a microscopic configuration of point defects acting as quantum bits is a key step in the advance of quantum information processing and sensing. Among the numerous candidates, silicon-vacancy related centers in silicon carbide (SiC) have shown remarkable properties owing to their particular spin-3/2 ground and excited states. Although, these centers were observed decades ago, two competing models, the isolated negatively charged silicon vacancy and the complex of negatively charged silicon… Show more

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Cited by 99 publications
(90 citation statements)
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References 46 publications
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“…Note that we follow the recent assignment of the cubic and hexagonal defect of V Si in Ref. 47 . Generic values are provided in panels In the p ++ -and p + -type layers and in most of the intrinsic layer, which is slightly p-type, the Fermi level is below the (0|-) transition level.…”
Section: Charge States Of the Silicon Vacancymentioning
confidence: 55%
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“…Note that we follow the recent assignment of the cubic and hexagonal defect of V Si in Ref. 47 . Generic values are provided in panels In the p ++ -and p + -type layers and in most of the intrinsic layer, which is slightly p-type, the Fermi level is below the (0|-) transition level.…”
Section: Charge States Of the Silicon Vacancymentioning
confidence: 55%
“…See the Supplementary Note 3 for the density of the created silicon vacancies as a function of the electron irradiation dose. The density of V C defects is in the range from 5×10 12 to 1×10 13 cm -3 , which is measured by deep-level transient spectroscopyIdentification of single silicon vacancies.In 4H-SiC, the silicon vacancy can be created at the two inequivalent lattice sites, namely the hexagonal and cubic sites, called V1 and V2 centre, respectively47 . Both defects possess very similar optical spectra with slightly different PL peaks.…”
mentioning
confidence: 99%
“…The most studied defects are the neutral divacancy or V Si V C (0) and negatively Color centers in SiC plotted versus their observed ZPL by PL measurements and their spin ZFS from electron paramagnetic resonance (EPR) or optically detected magnetic resonance (ODMR) measurements (left) for spin defects with proved optical spin polarization. Among these the V Si [40] V C V Si , [41,42] the N C V Si [43,44] in various polytypes. In addition, some transition metal color centers such as Ti [45], V [45][46][47], and Mo [48].…”
Section: Quantum Properties Of Silicon Carbide Color Centers (Ab Initmentioning
confidence: 99%
“…Only recently the V Si (−) role as qubit and charge state have been fully identified by means of high-precision first-principles calculations and high-resolution EPR resonance measurements, as an isolated negatively charged silicon-vacancy and it is associated to so-called V1 line being a V (−) Si at h (hexagonal)-site and V2 a V (−) Si at k (cubic) site for 4H-SiC [40], as for 6H V (−) Si the V1 is an h-site, V2 is a k2 site and V3 a k1 site [42]. In figures 3(A)-(C) the comparison between the cubic 3C and hexagonal 4H and 6H polytype SiC stacking layers seen from the top along the main crystallographic axis c, where the atoms of Si and C are shown along axis c or off-axis in different cubic h sites or hexagonal sites-k. For a single vacancy, it is expected that it occupies one of the 2 sites in 4H and 3 sites in 6H, as such the ZPLs are 2 or 3, plus excited state doublet.…”
Section: Quantum Properties Of Silicon Carbide Color Centers (Ab Initmentioning
confidence: 99%
“…Here we study the V2 defect with a zero phonon line at 916 nm at low temperature, since it can be detected in ODMR at room temperature [4,5]. The V2 is associated with the cubic k-site [15], and a zero-field fine structure splitting of 70 MHz.The sample used was purchased from CREE. The substrate is n-type LPBD.…”
mentioning
confidence: 99%