2014
DOI: 10.1016/j.matchar.2014.10.007
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Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps

Abstract: A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle.

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Cited by 23 publications
(13 citation statements)
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“…Sometimes domains inherited from different parent may have a disorientation angle lower than 3°. To ensure a correct identification of domains, the Anti-Leak Grain Identification (ALGrId) [28] was applied using a disorientation angle threshold of 0.2°. In the second step, each domain and its first neighbors are considered.…”
Section: Parent Reconstructionmentioning
confidence: 99%
“…Sometimes domains inherited from different parent may have a disorientation angle lower than 3°. To ensure a correct identification of domains, the Anti-Leak Grain Identification (ALGrId) [28] was applied using a disorientation angle threshold of 0.2°. In the second step, each domain and its first neighbors are considered.…”
Section: Parent Reconstructionmentioning
confidence: 99%
“…The reconstruction procedure is similar to that described by Germain and coworkers [13] and is performed in three steps. In a first step, crystallographic domains (grains) are identified using an Anti-Leak Grain detection [14] with 0 =3° and 1 =0°. In a second step, neighboring domains related by the Burgers orientation relationship (with a 3° tolerance) to a common parent orientation are sought.…”
Section: Materials and Experimental Setupmentioning
confidence: 99%
“…The result of this calculation gives the density distribution of GNDs over the EBSD mapped region from which the average density of GND's can be evaluated. (3) The sub-grains delimited by low disorientation boundaries were detected by an advanced sub-grain detection procedure [14,24] and the evolution of their average size according to the strain level was quantified. The classical EBSD grain recognition procedure clusters pixels disoriented from their neighbors by less than a threshold angle u 0 .…”
Section: Characterization Methodsmentioning
confidence: 99%
“…In addition, Accurate-ECCI experiments were also performed to image the dislocations induced by creep and their arrangement in very low sub-grain boundaries [22,23]. Moreover, an advanced sub-grain completion procedure was applied to the EBSD data to quantify the sub-grain size evolution [24]. Finally, Geometrically Necessary Dislocations (GNDs) densities were calculated using the ATEX software [14,25].…”
Section: Introductionmentioning
confidence: 99%