“…Common conditions include Li plating due to fast or lowtemperature charging or path-dependent aging; mild overcharge and overdischarge due to faulty or less-resilient sensors and management; nonuniform aging due to aggressive use or inadequate or faulty management; internal and external shorts due to latent manufacturing defects or incorrect use, inappropriate fixturing, or cell damage and aging; and divergent aging due to cell-to-cell variability. 17,[25][26][27][28][29][30][31][32][33][34][35][36][37][38] Literature surveys indicate the existence of a diverse set of diagnostics for LiB cells-diagnosing Li plating, [39][40][41][42][43][44] overcharge, [45][46][47] overdischarge, 45,48,49 internal shorts, [50][51][52][53] external shorts, [54][55][56] and electrode-and cell-level inhomogeneities 28,[57][58][59][60][61][62] -employing various thermal, electrochemical, acoustic, and entropy-based methods, often combined with different modeling-based approaches. Most of these methods are still in development; therefore, they have not been extended to module, string, or pack levels.…”