2014
DOI: 10.1038/srep06678
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Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting

Abstract: A practical experimental strategy is proposed that could potentially enable greater control of the tip apex in non-contact atomic force microscopy experiments. It is based on a preparation of a structure of interest alongside a reference surface reconstruction on the same sample. Our proposed strategy is as follows. Spectroscopy measurements are first performed on the reference surface to identify the tip apex structure using a previously collected database of responses of different tips to this surface. Next,… Show more

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Cited by 18 publications
(19 citation statements)
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“…The molecule can be stably imaged even using a reactive tip. Our results are also consistent with a recent study of NTCDI molecules on the Si(111)-(7 × 7) surface at low temperature 11 27 .…”
Section: Resultssupporting
confidence: 93%
“…The molecule can be stably imaged even using a reactive tip. Our results are also consistent with a recent study of NTCDI molecules on the Si(111)-(7 × 7) surface at low temperature 11 27 .…”
Section: Resultssupporting
confidence: 93%
“…On the basis of our simulations alone we cannot clearly distinguish between these two tip structures, but a recent theoretical study [33] suggests that electropositive tips such as the H-down NTCDI apex could react strongly with the Si(111) − 7×7 rest atoms. On the basis of the repulsive contrast over both adatoms and rest atoms observed experimentally, and noting the observation of similar contrast on Si(111) − 7×7 for tips prepared in the absence of adsorbed NTCDI molecules [26], we tentatively suggest the OHterminated tip model may be a more plausible candidate.…”
Section: Repulsive-type Tipsmentioning
confidence: 61%
“…The probe structure does not influence the image of molecular adsorbate because the tip-sample distance is such that the second plane of the tip aggregate does not contribute directly to the main tunneling current. The control of the tip apex structure and its orientation with respect to the surface is much less sensitive in STM than in the noncontact atomic force microscopy (AFM) [55][56][57][58], due to the z dependence of the tunnel current variation which is more acute for STM than for AFM.…”
Section: B Stm Image Calculationsmentioning
confidence: 99%