Illumination Dependence of Reverse Leakage Current in Silicon Solar Cells

Clement, Carlos Enrico; Singh, Jai Prakash; Birgersson, Erik; Wang, Yan; Khoo, Yong Sheng

doi:10.1109/jphotov.2021.3088005

Cited by 16 publications

(16 citation statements)

References 18 publications

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“…However, there is some deviation with the measurements at around SR = 25% as seen in Figure 7A,B. We attribute this to limitations in the current form of the split‐cell approach as mentioned in Clement et al 24 where illuminated reverse J–V curves are fitted through Bishop's equation despite falling outside of the model's scope. This was done as a compromise given the lack of an accepted physical explanation and consequent mathematical description of the illumination effects on p‐type cells.…”

Section: Model Validationmentioning

confidence: 84%

“…For the purposes of this study, we chose to model and test shingled modules manufactured from pPERC cells that were cut into 1/5 th pieces via thermal laser separation for improved mechanical properties 23 . From our previous study, we learned that p‐type cells exhibit an illumination‐dependent effect on their leakage current as the cell approaches breakdown 24 . As this phenomenon is not adequately captured by Bishop's leakage current model, we proposed a split‐cell model that accounts for light‐induced effects within the cell through a separate parallel subcircuit.…”

Section: Methodsmentioning

confidence: 99%

“…Mini‐modules were laminated on 20 × 20 cm glass with the same encapsulant and backsheet used in the full‐sized modules to eliminate any artefacts stemming from module material. To extract reverse parameters of the shaded and illuminated portions of a cell, we performed a negative voltage sweep on the mini‐modules at irradiance G = 0 and 1000 W/m 2 and fitted the curves following the procedure outlined in 24 . The parameters are photogenerated current ( J ph ), reverse saturation current ( J 0 ), series resistance ( R s ), shunt resistance at 0 and 1 sun ( R sh,dark , R sh,illum ), breakdown voltage at 0 and 1 sun ( V br,dark , V br,illum ), the fraction of avalanche current involved in leakage at 0 and 1 sun ( α dark , α illum ) and the avalanche breakdown exponent at 0 and 1 sun ( m dark , m illum ).…”

Section: Methodsmentioning

confidence: 99%

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Design of shading‐ and hotspot‐resistant shingled modules

Clement

Singh

Khoo³

et al. 2021

Progress in Photovoltaics

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The shingled module has become an attractive interconnection architecture for its higher packing density and superior power generation. However, with longer string lengths and smaller cell areas, these modules are particularly susceptible to developing hotspots from shading elements. In this paper, a framework for the design of hotspot-and shading-resistant shingled modules is presented. An electrothermal model is developed and validated extensively through specially fabricated shingled modules that allow for string-level measurement and analysis. To investigate the relative influence of cell electrical characteristics on power loss and hotspot temperature, we perform a stochastic Monte Carlo simulation which reveals a greater sensitivity to parameters associated with the shaded cell's leakage current. A further study on cells with illumination-dependent J leakage shows the detriment of this lightinduced effect where higher hotspot temperatures can develop. Module-level parameters are also investigated where string length, number of parallel strings, and cell fraction are studied in relation to their impact on module power and hotspot response. Finally, these findings are condensed into a design matrix which defines the space in which module manufacturers may configure shingled modules such that hotspots will not exceed a set threshold temperature.

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Section: Model Validationmentioning

confidence: 84%

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

See 1 more Smart Citation

Design of shading‐ and hotspot‐resistant shingled modules

Clement

Singh

Khoo³

et al. 2021

Progress in Photovoltaics

Self Cite

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“…We find good agreement between the measured data and both the numerical solution of (8) (solid line) and an LTspice simulation (dashed line) with the corresponding set of parameters. Recent findings by Clement et al [34] show, that for some cell architecture, the reverse bias characteristic can be significantly influenced by the irradiation level. We do not consider this in the article, but find it important to point it out.…”

Section: B Solar Cell Characteristicsmentioning

confidence: 99%

A Comprehensive Study of Module Layouts for Silicon Solar Cells Under Partial Shading

Klasen

Lux

Weber

et al. 2022

IEEE J. Photovoltaics

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Integrated applications for solar energy production becomes increasingly important. The electrification of car bodies and building facades are only two prominent examples. In such applications shading becomes a challenging problem, since the classic serial interconnection of solar cells in terms of power output is highly vulnerable to partial shading. In this article, we investigate the three most common module layouts in the market (conventional, butterfly, and shingle string) and add a fourth layout (shingle matrix) to be introduced to the market in the future. We discuss an approach to cluster shadings occurring in urban surroundings into basic shapes like "rectangular" and "random". Choosing a Monte Carlo technique in combination with latin hypercube sampling (LHS), we consider more than 3000 scenarios in total. For the evaluation of the scenarios, we conduct circuit simulations using LTspice. Furthermore, we define a normalization base, which considers only partial shading as a quantitative baseline for comparison. Our results show, that already for 200-400 scenarios the obtained output values stabilize. Among the investigated module layouts, the shingle matrix interconnection achieves the highest score, followed by a shingle string, half-cell butterfly and the conventional full-cell layout.

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“…In this case, no recovery was possible. This might be due to a significant breakdown or critical leakage in the current [23,24].…”

Section: Pid Cellmentioning

confidence: 99%