“…Basically, backscattered electrons carry much more information about the structure, e.g., crystallographic orientation or phase, so we are able to distinguish between grains or phases within the sample, identify interfaces, etc. [25,26] Different from micro-computed tomography (micro-CT), [10,27,28] EBSD allows determining effectively several microstructural parameters, such as grain geometry, particles and voids, grain-grain interfaces (boundary), grain morphology within particles or/and grains misorientation. Despite several advantages of the proposed methodology, EBSD investigation of sintered materials suffers also from a few limitations and deficiencies, such as the locally insufficient quality of the prepared sample surface (especially in the case of brittle and porous materials) and, hence, the several unsolved spots of the sample surface during the EBSD analysis, which may interfere the real representation of material microstructure.…”