Single quantum dots and other materials exhibit irregular switching between on and off states; these on-off states follow power-law statistics giving rise to 1/f noise. We transfer this phenomenon (also referred to as onoff intermittency) to the generation and recombination (= g-r) process in semiconductor materials. In addition to g-r noise we obtain 1/f noise that can be provided in the form of Hooge's relation. The predicted Hooge coefficient is αH = αX αim whereby αX depends on the parameters of the g-r noise and αim on the parameters of the intermittency. Due to the power-law distribution of the on-times, the coefficient αim shows a smooth dependence on time t. We also suggest an alternative form of Hooge's 1/f noise formula relating the 1/f noise to the number of centers (such as donor or trap atoms) rather than to the number of charge carriers as defined by Hooge.