In this work, a new dual-frequency imaging framework of capacitively coupled electrical impedance tomography (CCEIT) is presented. Unlike conventional singlefrequency imaging, the dual-frequency imaging adopts two different working frequencies to obtain the real part and the imaginary part of the impedance respectively. With the real part image and the imaginary part image at the two frequencies, the framework further introduces image fusion to obtain the fused image. This work focuses on optimization of the two working frequencies. To achieve the optimal selection of the two frequencies, data collection in a wide range frequency is carried out. The multifrequency data is then analyzed in depth and investigated from several aspects, including the measurement data, the sensitivity distribution and the imaging quality. Experiment was carried out with a 12-electrode CCEIT sensor, an impedance analyzer, and a computer to obtain the real part and imaginary part measurements of the impedance. Research results show that a low working frequency is recommended for the real part, while a relatively high working frequency is recommended for the imaginary part. Within the investigated frequency range of 200 kHz -20 MHz, the optimized frequencies for the real part and the imaginary part are 1 MHz and 15 MHz respectively. Results of verification experiment shows the superior performance of the two selected frequencies. Additionally, this paper demonstrates the advantages of the dual-frequency imaging framework. Compared with CCEIT in individual frequencies, CCEIT based on dualfrequency imaging with the two optimized frequencies has much better imaging performance.