2009
DOI: 10.1016/j.ultramic.2009.01.003
|View full text |Cite
|
Sign up to set email alerts
|

Image simulation of high resolution energy filtered TEM images

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

2
38
0

Year Published

2011
2011
2017
2017

Publication Types

Select...
3
3
1

Relationship

2
5

Authors

Journals

citations
Cited by 43 publications
(40 citation statements)
references
References 34 publications
2
38
0
Order By: Relevance
“…Proper settings were chosen to avoid beam damage and provide the best combination of signal-tonoise ratio, spatial and energy resolution. The results were simulated with the STEMSIM software package mimicking the experimental conditions [30][31][32][33]. Detailed experimental and simulation parameters can be found in the supplementary information [28].…”
mentioning
confidence: 99%
See 2 more Smart Citations
“…Proper settings were chosen to avoid beam damage and provide the best combination of signal-tonoise ratio, spatial and energy resolution. The results were simulated with the STEMSIM software package mimicking the experimental conditions [30][31][32][33]. Detailed experimental and simulation parameters can be found in the supplementary information [28].…”
mentioning
confidence: 99%
“…However, a discrepancy between signals A, B and the references is also apparent. This can be explained in terms of intermixing of the inelastic EELS signal due to delocalization and elastic scattering [31]. This intermixing causes a fraction of Mn 2þ signal to be measured at Mn 3þ columns and vice versa.…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…The final image or diffraction pattern is the intensity averaged over the different configurations. The electronic excitations are usually included by using the density matrix approach under the assumption that a single inelastic event takes place on a single atom at a given depth [4].The MULTEM program was developed with the purpose of performing accurate and fast multislice simulations for all different TEM experiments including high resolution TEM, electron diffraction (ED), precession ED, hollow cone imaging, convergent beam electron diffraction (CBED), convergent beam electron imaging, STEM, imaging STEM, energy filter transmission electron microscopy and STEM energy loss spectroscopy. MULTEM includes the phase object approximation (POA) and weak POA which provides qualitative description of the electron specimen interaction as well as the main atomic electron scattering parameterizations.…”
mentioning
confidence: 99%
“…The final image or diffraction pattern is the intensity averaged over the different configurations. The electronic excitations are usually included by using the density matrix approach under the assumption that a single inelastic event takes place on a single atom at a given depth [4].…”
mentioning
confidence: 99%