2012
DOI: 10.1063/1.4730396
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Imaging ambipolar diffusion of photocarriers in GaAs thin films

Abstract: Images of the steady-state luminescence of passivated GaAs self-standing films under excitation by a tightly-focussed laser are analyzed as a function of light excitation power. While unipolar diffusion of photoelectrons is dominant at very low light excitation power, an increased power results in a decrease of the diffusion constant near the center of the image due to the onset of ambipolar diffusion. The results are in agreement with a numerical solution of the diffusion equations and with a physical analysi… Show more

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Cited by 26 publications
(31 citation statements)
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“…Equation (B2) is approximate since, as justified in Ref [18], it assumes charge neutrality [n = δp]. Further, it neglects for simplicity the spatial dependences of electron and hole conductivities.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Equation (B2) is approximate since, as justified in Ref [18], it assumes charge neutrality [n = δp]. Further, it neglects for simplicity the spatial dependences of electron and hole conductivities.…”
Section: Discussionmentioning
confidence: 99%
“…Here, we present a theoretical and experimental investigation of the effect of degeneracy on spin transport in p + GaAs using a polarized microluminescence method in which the spin polarization is measured as a function of distance from a local, diffraction-limited excitation spot [17][18][19]. This study reveals that the dominant effect of degeneracy is the spin dependence of diffusion.…”
Section: Introductionmentioning
confidence: 99%
“…[8][9][10][11][12][13][14] However, the density of photoexcited carriers can strongly influence the measured diffusion coefficients. 8,13,14 Experiments on n-type semiconductors give a consistent result: D a is either an increasing or a flat function of photocarrier density. For instance, recent work on n-GaAs quantum wells has shown D a (or the related "ambipolar spin diffusion") to be increasing in lightly doped wells 15 and flat in nominally undoped wells.…”
Section: Introductionmentioning
confidence: 99%
“…4. The carrier diffusion length in the sample over this time window is ∼140 nm [29]. This is much shorter than the characteristic length scale in the experiment, i.e.…”
Section: Thz Diffraction Measurementsmentioning
confidence: 94%