2014
DOI: 10.1063/1.4879260
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Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

Abstract: High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well

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Cited by 30 publications
(30 citation statements)
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“…Thus, while the detected conductance variations of about one decade [4] or a factor of 4 [16] in ErMnO3 and of 25% in HoMnO3 [8] provide strong indications for different conductivities of domains and walls, no unequivocal information on the absolute value of the conductivity contrast is gathered. Recent photoemission electronmicroscopy experiments on ErMnO3 have demonstrated the intrinsic nature of the conductivity variation between domains and DWs [17] but this technique also does not provide absolute values. These are fundamental problems that go beyond hexagonal manganites and also apply to functional ferroelectric domain walls in other systems.…”
mentioning
confidence: 99%
“…Thus, while the detected conductance variations of about one decade [4] or a factor of 4 [16] in ErMnO3 and of 25% in HoMnO3 [8] provide strong indications for different conductivities of domains and walls, no unequivocal information on the absolute value of the conductivity contrast is gathered. Recent photoemission electronmicroscopy experiments on ErMnO3 have demonstrated the intrinsic nature of the conductivity variation between domains and DWs [17] but this technique also does not provide absolute values. These are fundamental problems that go beyond hexagonal manganites and also apply to functional ferroelectric domain walls in other systems.…”
mentioning
confidence: 99%
“…The key to discover or design multiferroic materials is a fundamental understanding of the microscopic coupling mechanisms, particularly, the behavior of the underlying domain structures, the role of spinorbit coupling, and the nanoscale confinement. Soft X-ray microscopies are therefore ideally suited to investigate such materials [206], [207].…”
Section: B Magnetic Dwsmentioning
confidence: 99%
“…The DC conduction current (j c ) measurements were made usually using macroscopic electrodes [5,12,15] and conductive tip of the atomic force microscope [7,13,16]. Some sophisticated techniques like Xray photoemission electron microscopy (XPEEM) and scanning nonlinear dielectric microscopy (SNDM) were also used [14,17].…”
Section: Introductionmentioning
confidence: 99%