2017
DOI: 10.1016/j.jmat.2017.07.001
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Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis

Abstract: Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques measure the polarization directly, and the fast formation kinetics of domains and screening charges cannot be captured by these quasi-static measurements. In this study, we used charge gradient microscopy (CGM) to image ferroelectric domains of lithium niobate base… Show more

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Cited by 7 publications
(5 citation statements)
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“…CGM is a scanning probe microscopy technique (first reported by Hong et al in 2014 [26] ), which allows spatial gradients in ferroelectric bound charge to be directly imaged, by monitoring currents passing through an earthed passive conducting AFM tip (usually solid platinum), pressed strongly into contact and rapidly scanned across the sample surface. Whether the technique involves changes in the screening charges at the surface of the metallic tip, or the "collection" of screening charge already aggregated on the ferroelectric free surface, is still a matter of debate [26][27][28][29] (see Note S2, Supporting Information). In any case though, the integration of the measured currents across stationary domain walls in CGM has been shown to reflect the switching charge associated with polar reorientation under the moving tip.…”
Section: Negative Capacitance and Measurements Using Charge Gradient mentioning
confidence: 99%
“…CGM is a scanning probe microscopy technique (first reported by Hong et al in 2014 [26] ), which allows spatial gradients in ferroelectric bound charge to be directly imaged, by monitoring currents passing through an earthed passive conducting AFM tip (usually solid platinum), pressed strongly into contact and rapidly scanned across the sample surface. Whether the technique involves changes in the screening charges at the surface of the metallic tip, or the "collection" of screening charge already aggregated on the ferroelectric free surface, is still a matter of debate [26][27][28][29] (see Note S2, Supporting Information). In any case though, the integration of the measured currents across stationary domain walls in CGM has been shown to reflect the switching charge associated with polar reorientation under the moving tip.…”
Section: Negative Capacitance and Measurements Using Charge Gradient mentioning
confidence: 99%
“…PCA has already proven to be a useful technique for denoising AFM measurements ( e.g. , charge gradient microscopy) and is described in detail in Supporting Information and elsewhere . Briefly, PCA performs a principal axis rotation of the variance–covariance matrix constructed from the original data set.…”
Section: Resultsmentioning
confidence: 99%
“…7(b) can be viewed as representing IV characteristics of the photocurrent. Further details on PCA can be found in our recent publication 51 .…”
Section: Discussionmentioning
confidence: 99%