2018
DOI: 10.1016/j.matlet.2017.09.110
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Imaging of edge inactive layer in micro-patterned graphene monolayer

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Cited by 3 publications
(2 citation statements)
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“…It is well known that the surface plasmon resonance frequency in GNRs is a function of the width and the carrier density of the ribbons. 348 Although challenging to characterize at the nanoscale, the inactive edge has been evidenced by Raman spectroscopy 349 and microwave atomic force microscopy 350,351 to show different characteristics than in the basal plane. In addition, Fei et al 352 also reported that the carrier density is enhanced near the sample edge using near-eld infrared nanoimaging in exfoliated graphene.…”
Section: One-and Two-dimensional Defects (Topological Defects)mentioning
confidence: 99%
“…It is well known that the surface plasmon resonance frequency in GNRs is a function of the width and the carrier density of the ribbons. 348 Although challenging to characterize at the nanoscale, the inactive edge has been evidenced by Raman spectroscopy 349 and microwave atomic force microscopy 350,351 to show different characteristics than in the basal plane. In addition, Fei et al 352 also reported that the carrier density is enhanced near the sample edge using near-eld infrared nanoimaging in exfoliated graphene.…”
Section: One-and Two-dimensional Defects (Topological Defects)mentioning
confidence: 99%
“…It is postulated by Yan et al that an “inactive” area on the edge of the GNRs about 28 nm wide reduces the width of the effective area in which the plasmons oscillate. The inactive edge, albeit difficult to characterize at the nanoscale, has been evidenced by Raman spectroscopy and microwave atomic force microscopy , to show different characteristics than in the basal plane. In addition to that, Fei and Rodin et al also alluded that in exfoliated graphene, the carrier density is enhanced near the sample edge by using near-field infrared nanoimaging .…”
Section: Introductionmentioning
confidence: 99%