Imaging of refractive index change by the reflection-mode scattering-type scanning near-field optical microscope: Simulation and observations

Sasaki, Hiroko; Sasaki, Yasuo

doi:10.1063/1.369497

Cited by 17 publications

(17 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…It is based on an atomic force microscope (AFM) and also consists of a laser source and a scattering light detection system. We used an AFM microcantilever (OMCL‐240‐TS1; Olympus Optical Co., Ltd.) as an apertureless probe for the RS‐SNOM (Sasaki & Sasaki, 1999). In this system the sample is illuminated and the signal is detected, both on the same side of the sample and therefore opaque materials can be observed.…”

Section: Methodsmentioning

confidence: 99%

See 1 more Smart Citation

Imaging of optical disc using reflection‐mode scattering‐type scanning near‐field optical microscopy

Yamaguchi

Sasaki

et al. 1999

Journal of Microscopy

View full text Add to dashboard Cite

A phase-change optical disc was observed using a reflection-mode scattering-type scanning near-field optical microscope (RS-SNOM). In an a.c.-mode SNOM image, the 1.2 microm x 0.6 microm recording marks were successfully observed although the data were recorded on the groove. In contrast, no recording marks could be resolved in a d.c.-mode SNOM image. These results are in good agreement with those from a numerical simulation using the finite difference time domain method. The resolution was better than 100 nm with a.c.-mode SNOM operation and the results indicate that recording marks in phase-change optical media can be directly observed with the RS-SNOM.

show abstract

Section: Methodsmentioning

confidence: 99%

“…Some groups have recently applied this algorithm to the optical field analysis of the SNOM. Their reports show the effectiveness of the FDTD simulation for both aperture‐ (Furukawa & Kawata, 1996) and scattering‐type SNOMs (Sasaki & Sasaki, 1999).…”

Section: Numerical Simulationmentioning

confidence: 99%

Imaging of optical disc using reflection‐mode scattering‐type scanning near‐field optical microscopy

Yamaguchi

Sasaki

et al. 1999

Journal of Microscopy

View full text Add to dashboard Cite

show abstract

“…[1][2][3][4][5] Many studies have been performed for this type of SNOM and several groups have successfully obtained high-resolution images, confirming that the scattering-type SNOM could be a high-resolution optical imaging tool. The most important task for this type of SNOM is the extraction of only the signal scattered from the probe, removing the light from various scattering sources on the sample such as discontinuities or inhomogeneities of the optical properties.…”

Section: Introductionmentioning

confidence: 97%

“…The ac-mode operation of the SNOM is often used among researchers using cantilever-type probes 4,5) as a general means for noise reduction, in which they oscillate the scattering probe vertically and detect the synchronous component of the scattering light using a lock-in amplifier. The authors demonstrated in a previous article that this method is effective in obtaining a high resolution both numerically and experimentally.…”

Section: Introductionmentioning

confidence: 99%

“…The authors demonstrated in a previous article that this method is effective in obtaining a high resolution both numerically and experimentally. 5) As we show in the following, however, the method is inadequate to completely remove the unwanted scattering from the sample. Here, we propose that the heterodyne detection of the modulated SNOM signal will solve this problem, and we demonstrate the effectiveness of this method.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Heterodyne Detection for the Extraction of the Probe-Scattering Signal in Scattering-Type Scanning Near-Field Optical Microscope

Sasaki

2000

Jpn. J. Appl. Phys.

Self Cite

View full text Add to dashboard Cite

We propose that heterodyne detection is useful for the scattering-type scanning near-field optical microscope (SNOM) to effectively remove the scattering from various sources on the sample which causes deterioration of the image resolution. First, we show in a simple model that this sample scattering cannot be completely removed by ac-mode detection of the SNOM signal for samples with high reflectivity, while only the probe-scattering signal can be extracted by heterodyne detection. Next, we show experimental results which compare the ac-mode and heterodyne images, and demonstrate the effectiveness of heterodyne detection.

show abstract

Near-field mapping of surface refractive-index distributions

et al. 2005

View full text Add to dashboard Cite

Scanning near-field optical microscopy (SNOM) in reflection is employed for high-resolution mapping of surface refractive-index distributions. Two different single-mode optical fibers with step-index profiles are characterized using a reflection SNOM setup, in which cross-polarized detection is employed to increase the contrast in optical images and, thereby, the method sensitivity. The SNOM images exhibit a clear ring-shaped structure associated with the fiber step-index profile, indicating that surface refractive-index variations being smaller than 10 −2 can be detected. It is found that the quantitative interpretation of SNOM images requires accurate characterization of a fiber tip used, because the detected optical signal is a result of interference between the optical fields reflected by the sample surface and by the fiber tip itself. The possibilities and limitations of this experimental technique are discussed. µmSurface refractive index imaging of core area (7.2 × 7.2 µm 2 ) of an optical fiber's cleaved edge, produced by scanning near-field optical microscope operating in collection and illumination mode simultaneously (the so called reflection SNOM)

show abstract

Imaging of refractive index change by the reflection-mode scattering-type scanning near-field optical microscope: Simulation and observations

Abstract: Reflection-mode scattering-type scanning near-field optical microscope using a laser trapped gold colloidal particle as a scattering probe

Cited by 17 publications

References 11 publications

Imaging of optical disc using reflection‐mode scattering‐type scanning near‐field optical microscopy

Imaging of optical disc using reflection‐mode scattering‐type scanning near‐field optical microscopy

Heterodyne Detection for the Extraction of the Probe-Scattering Signal in Scattering-Type Scanning Near-Field Optical Microscope

Near-field mapping of surface refractive-index distributions

Contact Info

Product

Resources

About