1998
DOI: 10.1103/physrevlett.81.1046
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Imaging the Elastic Nanostructure of Ge Islands by Ultrasonic Force Microscopy

Abstract: The structure of nanometer-sized strained Ge islands epitaxially grown on a Si substrate was studied using ultrasonic force microscopy (UFM), which combines the sensitivity to elastic structure of acoustic microscopy with the nanoscale spatial resolution of atomic force microscopy. UFM not only images the local surface elasticity variations between the Ge dots and the substrate with a spatial resolution of about 5 nm, but is also capable of detecting the strain variation across the dot, via the modification of… Show more

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Cited by 140 publications
(77 citation statements)
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“…Reported observations of molecular vibrations by Inelastic Scanning Tunnelling Spectroscopy (IESTS) require an electrically conducting substrate [1]. Atomic Force Microscopy (AFM) experiments involving ultrasonic oscillations of elastically indented samples [2,3] can be performed on electrically insulating systems, but yield subsurface images with nanoscale resolution at best. Building on the high spatial resolution and sensitivity of dynamic non-contact AFM [4,5], we introduce Damping Force Spectroscopy (DFS) as a non-invasive tool to study subsurface structure and vibrational modes in complex molecular systems at the atomic scale.…”
mentioning
confidence: 99%
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“…Reported observations of molecular vibrations by Inelastic Scanning Tunnelling Spectroscopy (IESTS) require an electrically conducting substrate [1]. Atomic Force Microscopy (AFM) experiments involving ultrasonic oscillations of elastically indented samples [2,3] can be performed on electrically insulating systems, but yield subsurface images with nanoscale resolution at best. Building on the high spatial resolution and sensitivity of dynamic non-contact AFM [4,5], we introduce Damping Force Spectroscopy (DFS) as a non-invasive tool to study subsurface structure and vibrational modes in complex molecular systems at the atomic scale.…”
mentioning
confidence: 99%
“…We elucidate the physical origin of damping in a microscopic model and provide quantitative interpretation of the observations by calculating the vibrational spectrum and damping of Dy@C82 inside nanotubes with different diameters using ab initio total energy and molecular dynamics calculations. [2,3] can be performed on electrically insulating systems, but yield subsurface images with nanoscale resolution at best. Building on the high spatial resolution and sensitivity of dynamic non-contact AFM [4, 5], we introduce Damping Force Spectroscopy (DFS) as a non-invasive tool to study subsurface structure and vibrational modes in complex molecular systems at the atomic scale.…”
mentioning
confidence: 99%
“…Although a number of techniques are available for surface characterization, methods to assess subsurface structures at the nanoscale remain largely in development. Several successful efforts at nanoscale subsurface imaging have involved combining the lateral resolution of the atomic force microscope 1 (AFM) with the nondestructive capability of acoustical methodologies for assessing subsurface features of materials [2][3][4][5][6][7][8][9][10][11] . The utilization of the AFM in principle provides the necessary lateral resolution for obtaining subsurface images at the nanoscale.…”
mentioning
confidence: 99%
“…Set-point P An additional assumption made in UFM measurements is related to the dynamic behavior of the AFM cantilever. The cantilever is usually regarded as a point mass with no dynamic response at high frequencies [KOL98]. For a cantilevered beam, the linear response w(x,t) to a high frequency excitation is a superposition of all modes given by…”
Section: Measurements and Analysismentioning
confidence: 99%