At the interface between complex insulating oxides, novel phases with interesting properties may occur, such as the metallic state reported in the LaAlO 3 /SrTiO 3 system [1].While this state has been predicted [2] and reported [3,4] to be confined at the interface, some works indicate a much broader spatial extension [5], thereby questioning its origin. Here we provide for the first time a direct determination of the carrier density profile of this system through resistance profile mappings collected in cross-section LaAlO 3 /SrTiO 3 samples with a conducting-tip atomic force microscope (CT-AFM). We find that, depending upon specific growth protocols, the spatial extension of the high-mobility electron gas can be varied from hundreds of microns into SrTiO 3 to a few nanometers next to the LaAlO 3 /SrTiO 3 interface.Our results emphasize the potential of CT-AFM as a novel tool to characterize complex oxide interfaces and provide us with a definitive and conclusive way to reconcile the body of experimental data in this system 2 Due to the richness of their intrinsic properties oxide materials can bring novel functionalities to electronics. Among all oxides, SrTiO 3 (STO) is particularly appealing because of its multifunctional character. It is a wide band gap semiconductor (3.2 eV) that becomes a high mobility metal [6] or even superconducting [7] upon oxygen vacancy doping.Stoichiometric STO is also at the fringe of ferroelectricity and its large dielectric permittivity, tunability and low microwave loss, makes it a good candidate for tunable microwave devicesThe potential of oxides is further enlarged by the fascinating properties of their interfaces, epitomized by the observation of ferromagnetism at the interface between two antiferromagnets [9] or of the quantum Hall effect in two-dimensional (2D) ZnO-based structures [10]. Recently, an electron gas with high electron mobility at low temperature (in the 10 4 cm 2 /Vs range) has been reported in heterostructures combining STO with LaAlO 3 (LAO), another band insulator [1]. Since its discovery by Ohtomo and Hwang [1], this unusual metallic state has been the object of many studies [2,3,4,5,11,12,13,14,15,16,17,18].Recent results include a two-dimensional superconducting behaviour at the LAO/STO interface below 200 mK [19], and indications of a ferromagnetic state below ~1K [20].The arguments invoked to explain the metallic state observed in such LAO/STO samples have been dual. A first interpretation relies on the transfer of a ½ e charge per unit cell at the interface, because of the polar discontinuity between positively charged LaO and neutral TiO 2 sub-planes [11]. In this picture a sheet carrier density n sheet ≈ 3.3 10 14 cm -2 is expected. However, in many cases the reported values of n sheet exceed this density by orders of magnitude [1,5,17]. This leads to another interpretation relying on the creation of oxygen vacancies in the STO substrate during the growth of the LAO film, which dopes the STO with electrons and makes it a high-mobility meta...