2015
DOI: 10.1002/smll.201500511
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Imaging the Predicted Isomerism of Oligo(aniline)s: A Scanning Tunneling Microscopy Study

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Cited by 11 publications
(14 citation statements)
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“…We based our initial structures on the isomers and conformations of other oligo(aniline)s determined by X‐ray diffraction,29 NMR spectroscopy,30 and STM,31 then minimised the geometries in Gaussian32 with a widely used DFT method: the B3LYP functional,33 the 6‐31G* basis set,34 and a polarisable continuum model35 (PCM) to account for solvation. The output of this first modelling step can be examined in a variety of ways,36 some of which are illustrated in Figure 2 for the radical cation of TDPB .…”
Section: Resultsmentioning
confidence: 99%
“…We based our initial structures on the isomers and conformations of other oligo(aniline)s determined by X‐ray diffraction,29 NMR spectroscopy,30 and STM,31 then minimised the geometries in Gaussian32 with a widely used DFT method: the B3LYP functional,33 the 6‐31G* basis set,34 and a polarisable continuum model35 (PCM) to account for solvation. The output of this first modelling step can be examined in a variety of ways,36 some of which are illustrated in Figure 2 for the radical cation of TDPB .…”
Section: Resultsmentioning
confidence: 99%
“…Fault et al. demonstrated by low temperature UHV‐STM investigations the importance of isomerism in the self‐assembly of monolayers of emeraldine state Ph/Ph and Ph/C 12 TANI [59] . Those results were fully supported by DFT calculations, and showed that the tetra(aniline) derivatives on a Cu (110) surface form disordered structures.…”
Section: Resultsmentioning
confidence: 92%
“…Unlike EB-state TANI -based materials, [ 24 ] fi lms prepared from ESstate TANI-C 8 (see the Experimental Section for details)…”
Section: Conductive-afm Patterning Of Organic Semiconductorsmentioning
confidence: 99%
“…Unlike EB-state TANI -based materials, [ 24 ] fi lms prepared from ESstate TANI-C 8 (see the Experimental Section for details) The atomic force microscope (AFM) has developed into a mature and widespread topography characterisation tool since its inception in the 1980s. The high resolution and precision nature of this tool has also led to widespread use, under ambient conditions, for diverse applications.…”
mentioning
confidence: 99%