Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review

Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald

doi:10.3390/jimaging4070088

Cited by 33 publications

(14 citation statements)

References 48 publications

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“…As backscattered electrons mainly originate from the near-surface region (<100 nm), EBSD is predominantly a surface sensitive technique. [39,59] The application of this technique to metal halide perovskites is, however, severely hindered by the sensitivity of these materials to beam-induced damage and is still in its infancy. [39,37] Efforts to circumvent these problems have been made by using highly sensitive cameras and low vacuum SEMs to minimize beam exposure and charge build-up in the perovskite.…”

Section: Resultsmentioning

confidence: 99%

“…The spatial resolution in EBSD is mainly determined by the size of the interaction volume of the primary electron beam and thus depends on the material and beam conditions used, and is typically in the range of 20–150 nm. [ 59 ] . As backscattered electrons mainly originate from the near‐surface region (<100 nm), EBSD is predominantly a surface sensitive technique.…”

Section: Resultsmentioning

confidence: 99%

“…As backscattered electrons mainly originate from the near‐surface region (<100 nm), EBSD is predominantly a surface sensitive technique. [ 39,59 ]…”

Section: Resultsmentioning

confidence: 99%

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Unraveling the Microstructure of Layered Metal Halide Perovskite Films

et al. 2020

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3D metal halide perovskites take on the form ABX 3 , in which A is typically either a small organic cation such as methylammonium or formamidinium or an inorganic cation such as cesium, B is a divalent metal, and the X-site is occupied by a halide ion. Following the success of these 3D metal halide perovskites, attention has recently (re)turned to their lowdimensional counterparts as a promising class of materials for a variety of optoelectronic applications. [1] Most notable of these are the layered metal halide compounds that take on the form A 2 BX 4. In these perovskitelike structures, layers of inorganic octahedra are separated by relatively large organic cations that act as an insulating barrier, thereby forming a natural quantum-well structure. [2,3] By adjusting the thickness or composition of the inorganic layer or organic cations, fundamental material parameters such as the bandgap, effective mass, and exciton binding energy can be tuned to cover a wide range of values. [4] The strong quantum and dielectric confinement in these layered 2D perovskites generally give rise to narrow excitonic luminescence spectra that make these materials particularly attractive candidates for the fabrication of color-pure light-emitting diodes and lasers. [5-8] In addition, despite their large exciton binding energies, 2D perovskites are also increasingly used in solar cells where the addition of small quantities of 2D perovskites is found to increase the thermal and ambient stability as well as the crystallinity of the 3D perovskite film.

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Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

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Unraveling the Microstructure of Layered Metal Halide Perovskite Films

et al. 2020

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“…Brodusch and his coauthors apply EBSD-DF to study minerals as well as magnetic domains in electrical steel, both in reflection. When EBSD-DF is applied in transmission (AA2099 Al-Li-Cu alloy), the visual effects which arising from this contrast mode are even more pronounced, revealing additional information about precipitates and deformation in the alloy's grain structure [13].…”

Section: Data Methods and Resultsmentioning

confidence: 99%

Phase-Contrast and Dark-Field Imaging

Zabler¹

2018

J. Imaging

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Very early, in 1896, Wilhelm Conrad Röntgen, the founding father of X-rays, attempted to measure diffraction and refraction by this new kind of radiation, in vain. Only 70 years later, these effects were measured by Ulrich Bonse and Michael Hart who used them to make full-field images of biological specimen, coining the term phase-contrast imaging. Yet, another 30 years passed until the Talbot effect was rediscovered for X-radiation, giving rise to a micrograting based interferometer, replacing the Bonse–Hart interferometer, which relied on a set of four Laue-crystals for beam splitting and interference. By merging the Lau-interferometer with this Talbot-interferometer, another ten years later, measuring X-ray refraction and X-ray scattering full-field and in cm-sized objects (as Röntgen had attempted 110 years earlier) became feasible in every X-ray laboratory around the world. Today, now that another twelve years have passed and we are approaching the 125th jubilee of Röntgen’s discovery, neither Laue-crystals nor microgratings are a necessity for sensing refraction and scattering by X-rays. Cardboard, steel wool, and sandpaper are sufficient for extracting these contrasts from transmission images, using the latest image reconstruction algorithms. This advancement and the ever rising number of applications for phase-contrast and dark-field imaging prove to what degree our understanding of imaging physics as well as signal processing have advanced since the advent of X-ray physics, in particular during the past two decades. The discovery of the electron, as well as the development of electron imaging technology, has accompanied X-ray physics closely along its path, both modalities exploring the applications of new dark-field contrast mechanisms these days. Materials science, life science, archeology, non-destructive testing, and medicine are the key faculties which have already integrated these new imaging devices, using their contrast mechanisms in full. This special issue “Phase-Contrast and Dark-field Imaging” gives us a broad yet very to-the-point glimpse of research and development which are currently taking place in this very active field. We find reviews, applications reports, and methodological papers of very high quality from various groups, most of which operate X-ray scanners which comprise these new imaging modalities.

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“…It is equipped with an 80mm 2X-Max SDD EDS detector with the EBSD Aztec HKL Advanced system. The high probe of this microscope with 1μA current allows the automatic EDS-EBSD mapping to create a montage of all the regions of a given specimen automatically at very high speed [9]. The BSE detector can produce quantitative three-dimensional maps of the surface of a specimen to quantify complicated and rough surfaces.…”

Section: Core Samples' Preparation Processmentioning

confidence: 99%

Experimental Investigations of Microwave Effects on Rock Breakage Using SEM Analysis

Teimoori

Hassani

Sasmito

et al. 2019

Proceedings 17th International Conference on Microwave and High Frequency Heating

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Preconditioning of hard rocks by microwave energy has recently been considered a potentially effective technology in mechanical rock breakage for civil and mining engineering. To obtain the amount of mechanical damage that a single-mode microwave treatment produces in rocks, it is necessary to analyze and evaluate the thermal cracking process by microwave heating at different power levels, exposure times, and distances from the antenna. The current study employs the scanning electron microscopy imaging technique to capture images from surfaces of irradiated rock specimens and to compare them with a nontreated specimen. To evaluate and quantify the amount of cracking (i.e. crack density, crack size, etc.) in a rock specimen after microwave irradiation with different microwave input operating parameters, the following steps were evaluated. First, several experiments of single-mode microwave treatments with different operating parameters were performed on rectangular specimens of basalt. Then, cylindrical core samples with a dimension of r = 0.5 cm, h = 2cm, were drilled from the center of the irradiated specimens and prepared for image processing. The results of the present study show that there are significant differences between the number of microcracks present in samples irradiated at different power levels and distances from the antenna. Also, longer exposure times result in more severe cracks.

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Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review

Cited by 33 publications

References 48 publications

Unraveling the Microstructure of Layered Metal Halide Perovskite Films

Unraveling the Microstructure of Layered Metal Halide Perovskite Films

Phase-Contrast and Dark-Field Imaging

Experimental Investigations of Microwave Effects on Rock Breakage Using SEM Analysis

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