2014
DOI: 10.1007/s10854-014-2489-7
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IMC growth and shear strength of Sn–Ag–Cu/Co–P ball grid array solder joints under thermal cycling

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Cited by 23 publications
(8 citation statements)
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“…The low melting point of Sn2.5Ag0.7Cu0.1RExNi system lead-free solder obviously affects the microstructure and mechanical properties of such solder joints. Microstructure and performance of these joints at the interface area are closely related to the morphology and size of interfacial IMCs and atomic diffusion during those thermal cycles [33,34]. Interface Cu atoms react with interface Sn and Ni atoms to generate Cu 3 Sn, Cu 6 Sn 5 and Ni 3 Sn 4 .…”
Section: Analysis and Discussionmentioning
confidence: 99%
“…The low melting point of Sn2.5Ag0.7Cu0.1RExNi system lead-free solder obviously affects the microstructure and mechanical properties of such solder joints. Microstructure and performance of these joints at the interface area are closely related to the morphology and size of interfacial IMCs and atomic diffusion during those thermal cycles [33,34]. Interface Cu atoms react with interface Sn and Ni atoms to generate Cu 3 Sn, Cu 6 Sn 5 and Ni 3 Sn 4 .…”
Section: Analysis and Discussionmentioning
confidence: 99%
“…The manufacturing difficulties and the reliability problems are generated with the decreasing of solder joint size. These problems are mainly focus on the IMCs in solder joints [6], and the brittle IMCs reduce strength of solder joints and produce Kirkendall voids [7]. The overgrowth of IMCs layer is effectively controlled by adding the appropriate alloying elements, such as Mn [8], Ni [9], Ce [10], Pr [11], Fe [12], Bi [13], Sb [14], In [15], Ag [16], Zn [17] and other nano-scale oxide particles [18,19].…”
Section: Introductionmentioning
confidence: 99%
“…Intermetallic compounds (IMCs) that formed between solders and substrates play an important role in solder joints, because the properties of IMCs are directly related to the performance and reliability of solder joints [1,3,5]. Sn is generally a major component in solders.…”
Section: Introductionmentioning
confidence: 99%
“…Sn is generally a major component in solders. When Sn reacts with Cu that is a conventional under bump metallization (UBM) on substrate, Cu 6 Sn 5 and Cu 3 Sn IMCs form [5][6][7][8][9][10]. Kirkendall voids usually form at the interface between Cu 3 Sn and Cu, which reduce the fracture toughness of solder joints and cause the joint failure [11][12][13]; therefore, a diffusion-barrier layer between Cu and solders is needed to eliminate the formation of IMCs between Cu and Sn.…”
Section: Introductionmentioning
confidence: 99%
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