1980
DOI: 10.1049/el:19800329
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Impact ionisation in multilayered heterojunction structures

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Cited by 226 publications
(53 citation statements)
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“…Noise was shown to increase with increasing aluminum mole fraction, in disagreement with the arguments of Chin et al [2]. The increase in noise is explained in terms of an increase in hole ionization in the Al Ga…”
Section: Discussioncontrasting
confidence: 53%
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“…Noise was shown to increase with increasing aluminum mole fraction, in disagreement with the arguments of Chin et al [2]. The increase in noise is explained in terms of an increase in hole ionization in the Al Ga…”
Section: Discussioncontrasting
confidence: 53%
“…4-6. The claims by Chin et al [2], and by others [3]- [7] that heterojunctions could be used in avalanche regions to reduce excess noise by tailoring the ratio via the band-edge discontinuity, have not been borne out [8]- [17]. Indeed, increasing the aluminum fraction above and hence band-edge discontinuity actually increases excess noise, as shown in Figs.…”
Section: Resultsmentioning
confidence: 94%
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“…This would open the way to sr6 d l high-quantum efficiency low-voltage low-noise detecti)rs in the near infrared. The first such proposal, by Chin et al [7], suggested the use of a multiquantum-well superlattice avalanche photodiode (SAPD) consisting of an 31-ternating series of wide-and narrow-bandgap layers. It has been shown both experimentally [SI- [lo], and tly means of many-particle Monte Carlo simulations [ 1 !…”
mentioning
confidence: 99%